Number of the records: 1

Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System

SYSNO	0205377
Title	Scanning Electron Microscopy of Nonconductive Specimens at Critical Energies in a Cathode Lens System
Author(s)	Frank, Luděk (UPT-D)_{RID, SAI, ORCID} Zadražil, Martin (UPT-D) Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID}
Source Title	Scanning. Roč. 23, č. 1 (2001), s. 36-50
Document Type	Článek v odborném periodiku
Grant	GA202/96/0961 GA ČR - Czech Science Foundation (CSF)
	GA202/99/0008 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z2065902 - UPT-D
Language	eng
Country	US
Keywords	scanning electron microscopy * specimen charging * nonconductive specimens
Permanent Link	http://hdl.handle.net/11104/0100991

Number of the records: 1