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Elemental analysis with neutron beams: neutron depth profiling
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SYSNO 0185810 Title Elemental analysis with neutron beams: neutron depth profiling Document part Vol.9, Vol.9 Author(s) Vacík, Jiří (UJF-V) RID, ORCID, SAI
Červená, Jarmila (UJF-V)
Hnatowicz, Vladimír (UJF-V) RID
Naramoto, H. (JP)Issue data Tokyo: Japan Electrochemical Society, 2003 Conference Regular Meeting of Japan Electrochemical Society, Tokyo, 07.10.2002 Document Type Konferenční sborník (zahraniční konf.) CEZ AV0Z1048901 - UJF-V Language eng Country JP Keywords NDP * elemental analysis Permanent Link http://hdl.handle.net/11104/0082174
Number of the records: 1