Residual Stress Determination by Whole Pattern Analysis-Application to Synchrotron HEXRD Measurements on Thermal Sprayed Coatings

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SYSNO	0178915
Title	Residual Stress Determination by Whole Pattern Analysis-Application to Synchrotron HEXRD Measurements on Thermal Sprayed Coatings
Author(s)	Gnaeupel-Herold, T. (US) Haeffner, D. R. (US) Prask, H. J. (US) Matějíček, Jiří (UFP-V)_{RID, ORCID}
Source Title	Proceedings of the 6th International Conference on Residual Stresses. s. 751-758. - London : IOM Communications Ltd., 2000
Conference	International Conference on Residual Stresses/6th./, Oxford, 10.07.2000-12.07.2000
Document Type	Konferenční příspěvek (zahraniční konf.)
CEZ	AV0Z2043910 - UFP-V
Language	eng
Country	GB
Keywords	thermal sprayed
Permanent Link	http://hdl.handle.net/11104/0075757

Number of the records: 1