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Electron yield from Be-Cu induced by highly charged Xe q+ ions
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SYSNO 0133977 Title Electron yield from Be-Cu induced by highly charged Xe q+ ions Author(s) Krása, Josef (FZU-D) RID, ORCID
Láska, Leoš (FZU-D)
Stöckli, M. P. (US)
Fehrenbach, C. W. (US)Source Title Nuclear Instruments & Methods in Physics Research Section B. Roč. 196, - (2002), s. 61-67. - : Elsevier Document Type Článek v odborném periodiku Grant IAA1010105 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LN00A100 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z1010921 - FZU-D Language eng Country NL Keywords highly charged ion-induced electron emission * angle impact effect * Be-Cu Permanent Link http://hdl.handle.net/11104/0031924
Number of the records: 1