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Determination of Roughness Factor and Fractal Dimension of Zirconium in its Native and Surface Modified State using Atomic Force Microscopy. Effect of the Hydrogen Evolution Reaction on the Surface Structure

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    SYSNO ASEP0490032
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleDetermination of Roughness Factor and Fractal Dimension of Zirconium in its Native and Surface Modified State using Atomic Force Microscopy. Effect of the Hydrogen Evolution Reaction on the Surface Structure
    Author(s) Novák, M. (CZ)
    Kocábová, Jana (UFCH-W) RID
    Kolivoška, Viliam (UFCH-W) RID, ORCID
    Pospíšil, Lubomír (UFCH-W) RID, ORCID
    Macák, J. (CZ)
    Cichoň, Stanislav (FZU-D) RID, ORCID
    Cháb, Vladimír (FZU-D) RID, ORCID
    Hromadová, Magdaléna (UFCH-W) RID, ORCID, SAI
    Source TitleXXXVIII. Moderní elektrochemické metody. Sborník přednášek. - Ústí nad Labem : Best Servis, 2018 / Navrátil T. ; Fojta M. ; Schwarzová K. - ISBN 978-80-905221-6-9
    Pagess. 173-177
    Number of pages5 s.
    Publication formPrint - P
    ActionModerní elektrochemické metody /38./
    Event date21.05.2018 - 25.05.2018
    VEvent locationJetřichovice
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordszirconium electrode ; atomic force microscopy ; fractal dimension
    Subject RIVCG - Electrochemistry
    OECD categoryElectrochemistry (dry cells, batteries, fuel cells, corrosion metals, electrolysis)
    Subject RIV - cooperationInstitute of Physics - Solid Matter Physics ; Magnetism
    R&D ProjectsGA16-03085S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUFCH-W - RVO:61388955 ; FZU-D - RVO:68378271
    UT WOS000464596500039
    AnnotationAtomic force microscopy (AFM) was used to characterize surface morphology of pristine zirconium, Si modified and FeSi modified zirconium electrodes prior and after hydrogen evolution at potentials negative of the open circuit potential value. Two main characteristic parameters were obtained from the ex situ AFM height images, namely, the roughness factor and fractal dimension of the studied surface. The effect of hydrogen evolution reaction on the electrode surface morphology was discussed. Fractal dimension values were used successfully to explain the non ideality of the interfacial capacitance.
    WorkplaceJ. Heyrovsky Institute of Physical Chemistry
    ContactMichaela Knapová, michaela.knapova@jh-inst.cas.cz, Tel.: 266 053 196
    Year of Publishing2020
Number of the records: 1  

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