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Secondary electron hyperspectral imaging for the study of degradation processes in paintings
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SYSNO ASEP 0511327 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title Secondary electron hyperspectral imaging for the study of degradation processes in paintings Author(s) Mika, Filip (UPT-D) RID, SAI, ORCID
Švarcová, Silvie (UACH-T) SAI, RID, ORCID
Pokorná, Zuzana (UPT-D) RID, ORCID, SAI
Hradil, David (UACH-T) RID, SAINumber of authors 4 Source Title 7th Interdisciplinary ALMA Conference. Book of Abstracts. - Bratislava : Slovak University of Technology, 2019
S. 72-73Number of pages 2 s. Publication form Print - P Action Interdisciplinary ALMA Conference /7./ Event date 16.10.2019 - 18.10.2019 VEvent location Bratislava Country SK - Slovakia Event type EUR Language eng - English Country SK - Slovakia Keywords secondary electron ; hyperspectral imaging Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Coating and films Subject RIV - cooperation Institute of Inorganic Chemistry Institutional support UPT-D - RVO:68081731 ; UACH-T - RVO:61388980 Annotation Secondary Electron Hyperspectral Imaging (SEHI) represents a novel complementary technique to the scanning electron microscopy (SEM) and energy-dispersive spectroscopy (EDS) which are well established and routinely used in the field of cultural heritage for analysis of micro-samples. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2020
Number of the records: 1