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Preparation of surfaces of composite samples for tip based micro-analyses using ion beam milling
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SYSNO ASEP 0497196 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Preparation of surfaces of composite samples for tip based micro-analyses using ion beam milling Author(s) Pinc, J. (CZ)
Dendisová, M. (CZ)
Kolářová, K. (CZ)
Gedeon, O. (CZ)
Švecová, M. (CZ)
Hradil, David (UACH-T) RID, SAI
Hradilová, J. (CZ)
Bartůněk, V. (CZ)Number of authors 8 Source Title Micron. - : Elsevier - ISSN 0968-4328
Roč. 116, JAN (2019), s. 1-4Number of pages 4 s. Language eng - English Country GB - United Kingdom Keywords Atomic force microscopy ; Composite ; Ion beam ; Material in resin ; TERS ; Tip methods Subject RIV CA - Inorganic Chemistry OECD category Inorganic and nuclear chemistry Method of publishing Open access with time embargo (01.01.2021) Institutional support UACH-T - RVO:61388980 UT WOS 000452565500001 EID SCOPUS 85053177782 DOI 10.1016/j.micron.2018.09.003 Annotation Ion beam milling, as a method of surface design for tip analytical techniques, was explored. A sample of clay, embedded in a resin, was treated by the ion beam and allowed AFM (a typical tip technique) to be successfully applied. The method is suitable for advanced tip analyses based on AFM, like TERS or SNOM, and for samples that are not possible to prepare by standard mechanical methods. The approach can be useful for characterisation of the surfaces of many different types of materials in versatile applications such as catalysis, corrosion science or advanced material characterisation. Workplace Institute of Inorganic Chemistry Contact Jana Kroneislová, krone@iic.cas.cz, Tel.: 311 236 931 Year of Publishing 2020 Electronic address http://hdl.handle.net/11104/0289771
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