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Refining Bimodal Microstructure of Materials with MSTRUCT

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    SYSNO ASEP0438129
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleRefining Bimodal Microstructure of Materials with MSTRUCT
    Author(s) Matěj, Z. (CZ)
    Kadlecová, A. (CZ)
    Janeček, M. (CZ)
    Matějová, Lenka (UCHP-M) RID, ORCID, SAI
    Dopita, M. (DE)
    Kužel, R. (CZ)
    Source TitlePowder Diffraction. - : Cambridge University Press - ISSN 0885-7156
    Roč. 29, S2 (2014), S35-S41
    Number of pages7 s.
    Languageeng - English
    CountryUS - United States
    KeywordsXRD ; bimodal ; crystallite size
    Subject RIVBM - Solid Matter Physics ; Magnetism
    R&D ProjectsGA14-23274S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUCHP-M - RVO:67985858
    UT WOS000353563000007
    EID SCOPUS84919398487
    DOI10.1017/S0885715614000852
    AnnotationThe possibilities of modelling the diffraction profiles from bimodal microstructure in computer program MSTRUCT are demonstrated on two examples. A special Double Component profile effect can be utilized for such problems. At first it was applied to an analysis of a mixture of two nanocrystalline anatase powders with different crystallite sizes and the relative ratio of both components was determined from X-ray diffraction data. In the second case study, diffraction peaks from a pure polycrystalline copper sample treated by equal channel angular pressing were fitted using a two-phase model of large recrystallized defect-free grains and ultrafine crystallites with high dislocation density. The method is shown to be suitable for determination of the relative fraction of the microstructural components as well as other parameters (e.g. dislocation density).
    WorkplaceInstitute of Chemical Process Fundamentals
    ContactEva Jirsová, jirsova@icpf.cas.cz, Tel.: 220 390 227
    Year of Publishing2015
Number of the records: 1  

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