Number of the records: 1  

Qualification of 1030 nm ultra-short-pulsed laser for glass sheet treatment in TGV process

  1. 1.
    SYSNO ASEP0568504
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleQualification of 1030 nm ultra-short-pulsed laser for glass sheet treatment in TGV process
    Author(s) Vanda, Jan (FZU-D) RID, ORCID
    Muresan, Mihai-George (FZU-D) ORCID
    Čech, Pavel (FZU-D)
    Mydlář, Martin (FZU-D)
    Pilná, Kateřina (FZU-D)
    Smrž, Martin (FZU-D) RID, ORCID
    Chyla, Michal (FZU-D) RID, ORCID
    Mužík, Jiří (FZU-D) ORCID
    Štěpánková, Denisa (FZU-D) ORCID
    Brajer, Jan (FZU-D) ORCID
    Mocek, Tomáš (FZU-D) RID, ORCID, SAI
    Stoklasa, B. (CZ)
    Venos, Š. (CZ)
    Kuchařík, J. (CZ)
    Number of authors14
    Article number1198804
    Source TitleLaser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XXVII. - Bellingham : SPIE, 2022 / Qiao J. ; Narazaki A. ; Gemini L. - ISSN 0277-786X - ISBN 978-1-5106-4848-7
    Number of pages12 s.
    Publication formOnline - E
    ActionSPIE LASE
    Event date22.01.2022 - 28.02.2022
    VEvent locationSan Francisco
    CountryUS - United States
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsglasses ; pulsed laser operation ; etching ; laser damage threshold ; laser development ; laser processing
    Subject RIVBH - Optics, Masers, Lasers
    OECD categoryOptics (including laser optics and quantum optics)
    R&D ProjectsEF15_006/0000674 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LO1602 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2015086 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    TM01000021 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportFZU-D - RVO:68378271
    UT WOS000844454100003
    EID SCOPUS85131219689
    DOI10.1117/12.2610143
    AnnotationGlass sheets with ~ 0.1 mm thickness are a promising material from which interposers for high density chip packaging can be produced due to its electrical and mechanical properties. For successful application in microelectronics, it is necessary to develop a way of efficient, high-speed production of interconnecting holes through such glass substrate, socalled through glass vias (TGVs). One of the most promising technique is Laser-Induced Deep Etching (LIDE), where picosecond laser is used to modified particular areas on the glass substrate. Then, using wet etching process, the area exposed to the laser will be etched more quickly than unexposed area. However, effective and large-scale glass modification often requires use of high-energy pulsed UV laser source, which unnecessary complicates the whole application. Here we present effective preparation of treated glass substrate using Yb:YAG laser at its fundamental wavelength 1030 nm, which is capable to overcome such disadvantage.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2023
    Electronic addresshttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/11988/2610143/Qualification-of-1030-nm-ultra-short-pulsed-laser-for-glass/10.1117/12.2610143.short?SSO=1
Number of the records: 1  

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