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Copper tungsten oxide (Cu.sub.x./sub.WO.sub.y./sub.) thin films for optical and photoelectrochemical applications deposited by reactive high power impulse magnetron co-sputtering
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SYSNO ASEP 0566773 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Copper tungsten oxide (CuxWOy) thin films for optical and photoelectrochemical applications deposited by reactive high power impulse magnetron co-sputtering Author(s) Hrubantová, Aneta (FZU-D) ORCID
Hippler, Rainer (FZU-D) ORCID
Wulff, H. (DE)
Čada, Martin (FZU-D) RID, ORCID, SAI
Gedeon, O. (CZ)
Jiříček, Petr (FZU-D) RID, ORCID, SAI
Houdková, Jana (FZU-D) RID, ORCID
Olejníček, Jiří (FZU-D) RID, ORCID
Nepomniashchaia, Natalia (FZU-D) ORCID
Helm, C.A. (DE)
Hubička, Zdeněk (FZU-D) RID, ORCID, SAINumber of authors 11 Article number 215301 Source Title Journal of Applied Physics. - : AIP Publishing - ISSN 0021-8979
Roč. 132, č. 21 (2022)Number of pages 13 s. Language eng - English Country US - United States Keywords HiPIMS ; sputtering ; photoelectrochemical activity ; FTO glass ; film properties Subject RIV BL - Plasma and Gas Discharge Physics OECD category Coating and films R&D Projects EF16_019/0000760 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA21-04477S GA ČR - Czech Science Foundation (CSF) Research Infrastructure CzechNanoLab - 90110 - Vysoké učení technické v Brně Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 000894517100001 EID SCOPUS 85144137293 DOI 10.1063/5.0123075 Annotation Copper tungsten oxide films are deposited with the help of reactive high power impulse magnetron sputtering (HiPIMS) in an argon/oxygen gas mixture. Two magnetrons, one equipped with a tungsten target and the other with a copper target, are employed. The HiPIMS discharge is operated with a repetition frequency of f ¼ 100 Hz. Pulse widths of 100 and 20 μs separated by 25 μs are chosen for the tungsten and copper target, respectively. Films deposited on two different glass substrates [soda lime glass and fluorine doped tin oxide (FTO) coated glass] are characterized by energy dispersive x-ray spectroscopy, x-ray photoelectron spectroscopy, x-ray diffraction, Raman spectroscopy, and ellipsometry. Photoelectrochemical activity was investigated by linear voltammetry. Annealed films deposited on FTO glass are composed of WO3 and CuWO4 or Cu2WO4 crystal phases. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2023 Electronic address https://hdl.handle.net/11104/0338068
Number of the records: 1