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Copper tungsten oxide (Cu.sub.x./sub.WO.sub.y./sub.) thin films for optical and photoelectrochemical applications deposited by reactive high power impulse magnetron co-sputtering

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    SYSNO ASEP0566773
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleCopper tungsten oxide (CuxWOy) thin films for optical and photoelectrochemical applications deposited by reactive high power impulse magnetron co-sputtering
    Author(s) Hrubantová, Aneta (FZU-D) ORCID
    Hippler, Rainer (FZU-D) ORCID
    Wulff, H. (DE)
    Čada, Martin (FZU-D) RID, ORCID, SAI
    Gedeon, O. (CZ)
    Jiříček, Petr (FZU-D) RID, ORCID, SAI
    Houdková, Jana (FZU-D) RID, ORCID
    Olejníček, Jiří (FZU-D) RID, ORCID
    Nepomniashchaia, Natalia (FZU-D) ORCID
    Helm, C.A. (DE)
    Hubička, Zdeněk (FZU-D) RID, ORCID, SAI
    Number of authors11
    Article number215301
    Source TitleJournal of Applied Physics. - : AIP Publishing - ISSN 0021-8979
    Roč. 132, č. 21 (2022)
    Number of pages13 s.
    Languageeng - English
    CountryUS - United States
    KeywordsHiPIMS ; sputtering ; photoelectrochemical activity ; FTO glass ; film properties
    Subject RIVBL - Plasma and Gas Discharge Physics
    OECD categoryCoating and films
    R&D ProjectsEF16_019/0000760 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA21-04477S GA ČR - Czech Science Foundation (CSF)
    Research InfrastructureCzechNanoLab - 90110 - Vysoké učení technické v Brně
    Method of publishingOpen access
    Institutional supportFZU-D - RVO:68378271
    UT WOS000894517100001
    EID SCOPUS85144137293
    DOI10.1063/5.0123075
    AnnotationCopper tungsten oxide films are deposited with the help of reactive high power impulse magnetron sputtering (HiPIMS) in an argon/oxygen gas mixture. Two magnetrons, one equipped with a tungsten target and the other with a copper target, are employed. The HiPIMS discharge is operated with a repetition frequency of f ¼ 100 Hz. Pulse widths of 100 and 20 μs separated by 25 μs are chosen for the tungsten and copper target, respectively. Films deposited on two different glass substrates [soda lime glass and fluorine doped tin oxide (FTO) coated glass] are characterized by energy dispersive x-ray spectroscopy, x-ray photoelectron spectroscopy, x-ray diffraction, Raman spectroscopy, and ellipsometry. Photoelectrochemical activity was investigated by linear voltammetry. Annealed films deposited on FTO glass are composed of WO3 and CuWO4 or Cu2WO4 crystal phases.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2023
    Electronic addresshttps://hdl.handle.net/11104/0338068
Number of the records: 1  

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