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Vacuum ultraviolet photoconductive detector based on anatase TiO.sub.2./sub. thin film deposited on SiO.sub.2./sub. substrate
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SYSNO ASEP 0566731 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Vacuum ultraviolet photoconductive detector based on anatase TiO2 thin film deposited on SiO2 substrate Author(s) Cadatal-Raduban, M.M. (NZ)
Olejníček, Jiří (FZU-D) RID, ORCID
Kohout, Michal (FZU-D) RID, ORCID
Yamanoi, K. (JP)
Horiuchi, Y. (JP)
Kato, T. (JP)
Ono, S. (JP)Number of authors 7 Source Title Materials Today: Proceedings. Vol. 60. - Amsterdam : Elsevier Ltd., 2022 - ISSN 2214-7853 Pages s. 1160-1164 Number of pages 5 s. Publication form Online - E Action International Conference on Science and Engineering of Materials (ICSEM) /4./ Event date 19.07.2021 - 22.07.2021 VEvent location Noida Country IN - India Event type WRD Language eng - English Country NL - Netherlands Keywords wide band gap ; semiconductor ; TiO2 ; thin film ; high energy ; detector Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects FV20580 GA MPO - Ministry of Industry and Trade (MPO) Institutional support FZU-D - RVO:68378271 UT WOS 000836437200028 EID SCOPUS 85128272667 DOI 10.1016/j.matpr.2022.03.154 Annotation We report on titanium dioxide (TiO2) thin film deposited on a quartz (SiO2) substrate as an improved photoconductive detector for radiation below 200 nm wavelength (vacuum ultraviolet region, VUV). The crystalline film has an anatase phase and an average crystallite size of 10.6 nm. It has a transmission edge at 322 nm and an optical band gap of 3.18 ± 0.02 eV. Under VUV illumination, the TiO2 photoconductive detector exhibited a photocurrent of 5.3 mA at an applied bias voltage of 100 V. The dark current measured without VUV illumination and at the same bias voltage is 8.8 x 106 mA, which is 6 orders of magnitude smaller compared to the photocurrent. The photoconductive VUV detector based on TiO2 thin film provides a means of directly measuring VUV radiation compared to detection via the photoluminescence of a scintillator. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2023
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