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A brief overview of the studies on the irreversible breakdown of LGAD testing samples irradiated at the critical LHC-HL fluences
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SYSNO ASEP 0566384 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title A brief overview of the studies on the irreversible breakdown of LGAD testing samples irradiated at the critical LHC-HL fluences Author(s) Laštovička-Medin, G. (ME)
Kramberger, G. (SI)
Rebarz, Mateusz (FZU-D) ORCID
Andreasson, Jakob (FZU-D) ORCID
Kropielnicki, Kamil (FZU-D) ORCID
Laštovička, Tomáš (FZU-D) RID, ORCID
Kroll, Jiří (FZU-D) ORCIDNumber of authors 7 Article number C07020 Source Title Journal of Instrumentation. - : Institute of Physics Publishing - ISSN 1748-0221
Roč. 17, č. 7 (2022)Number of pages 5 s. Language eng - English Country GB - United Kingdom Keywords charge induction ; radiation-hard detectors ; solid state detectors ; timing detectors Subject RIV BL - Plasma and Gas Discharge Physics OECD category Fluids and plasma physics (including surface physics) R&D Projects LM2018141 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) EF16_019/0000789 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) EF15_003/0000447 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Method of publishing Limited access Institutional support FZU-D - RVO:68378271 UT WOS 000933446100020 EID SCOPUS 85135223849 DOI 10.1088/1748-0221/17/07/C07020 Annotation LGAD sensors will be employed in the CMS MTD and ATLAS HGTD upgrades to mitigate the high levels of pile-up expected in the High Luminosity phase of the LHC. Over the last several years, much attention has been focused on designing radiation tolerant gain implants to ensure that these sensors survive the expected fluences, (more than 1–2 × 1015 neq/cm2). However, in test beams with protons and a fs-laser, highly irradiated LGADs operated at a high voltage, have been seen to exhibit violent burn-out events that render the sensors inoperable. This paper will focus on the critical electric field and accordingly the bias thresholds to mitigate the risk of Single Event Burnout (SEB). Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2023 Electronic address https://doi.org/10.1088/1748-0221/17/07/C07020
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