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The multi-energetic Au ion implantation of graphene oxide and polymers

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    SYSNO ASEP0565866
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleThe multi-energetic Au ion implantation of graphene oxide and polymers
    Author(s) Malinský, Petr (UJF-V) RID, ORCID, SAI
    Novák, Josef (UJF-V) ORCID
    Štěpanovská, Eva (UJF-V) ORCID
    Slepička, P. (CZ)
    Švorčík, V. (CZ)
    Szokolova, K. (CZ)
    Marvan, P. (CZ)
    Sofer, Z. (CZ)
    Macková, Anna (UJF-V) RID, ORCID, SAI
    Number of authors9
    Article number02006
    Source TitleEPJ Web of Conferences, 261. - Les ulis : EDP sciences, 2022
    Number of pages9 s.
    Publication formOnline - E
    ActionApplied Nuclear Physics Conference (ANPC 2021)
    Event date12.09.2021 - 17.09.2021
    VEvent locationPrague
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryFR - France
    KeywordsGO ; PET ; PLLA
    OECD categoryAtomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
    R&D ProjectsGA19-02482S GA ČR - Czech Science Foundation (CSF)
    Research InfrastructureCANAM II - 90056 - Ústav jaderné fyziky AV ČR, v. v. i.
    Institutional supportUJF-V - RVO:61389005
    DOI10.1051/epjconf/202226102006
    AnnotationThe electric properties of polymers are increasingly important in a wide range of applications such as sensors, energy storages, microelectronics, and filtration membranes among others. In this work, the effect of multi-energetic Au ion implantation on the graphene oxide (GO), polyimide (PI), polyethylene terephthalate (PET) and polylactide (PLLA) elemental, chemical, structural end electric properties is presented with potential application in 3D metal-dielectric structure synthetization. The three energies, 3.2, 1.6, 0.8 MeV of Au ions with fluence 3.75×1014 cm-2 were used in ascending or descending order to create two sample sets, which were subsequently analysed by RBS, ERDA, EDS and AFM. RBS analysis was used for Au-depth profile characterization in the implanted samples, the profiles agree reasonably with those simulated by SRIM code. Electrical properties were investigated by standard two-point technique with respect to the used parameters of the ion irradiation. The sheet resistance decreases after ion irradiation and it is evident that the ascending order of ion implantation energies has more significant effect on the conductivity enhancement compare to the descending one.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2023
    Electronic addresshttps://doi.org/10.1051/epjconf/202226102006
Number of the records: 1  

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