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Modification of polymethylmethacrylate under irradiation of the SEM electron beam
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SYSNO ASEP 0563493 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Modification of polymethylmethacrylate under irradiation of the SEM electron beam Author(s) Havránek, Vladimír (UJF-V) RID, SAI, ORCID
Torrisi, L. (IT)
Silipigni, L. (IT)
Macková, Anna (UJF-V) RID, ORCID, SAI
Malinský, Petr (UJF-V) RID, ORCID, SAI
Cutroneo, Mariapompea (UJF-V) ORCID, RID, SAINumber of authors 6 Source Title Radiation Effects and Defects in Solids. - : Taylor & Francis - ISSN 1042-0150
Roč. 177, 11-12 (2022), s. 1222-1231Number of pages 10 s. Publication form Print - P Language eng - English Country GB - United Kingdom Keywords Polymethylmethacrylate ; electron beam ; morphology ; SEM-EDX OECD category Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect) R&D Projects GA22-10536S GA ČR - Czech Science Foundation (CSF) EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Research Infrastructure CANAM II - 90056 - Ústav jaderné fyziky AV ČR, v. v. i. Method of publishing Limited access Institutional support UJF-V - RVO:61389005 UT WOS 000871374100001 EID SCOPUS 85140712489 DOI 10.1080/10420150.2022.2136085 Annotation This paper is focused on the study of the modifications of polymethymethacrylate (PMMA) under the irradiation of electron beams. PMMA is a well-known thermoplastic synthetic polymer, with unique features such as transparency, good tensile strength, and moldability. Its performance can be significantly modified through the realization of functionalized thin film coatings, ion irradiations, laser irradiations for different applications, such as flexible electronics, biomaterials, dielectric layers and sensors. The purpose of this paper is to describe the changes of the PMMA features as a function of the energy and fluence of electron beams. The morphology of the obtained structures is studied by electron scanning microscopy while the C/ O atomic ratios are monitored by the energy dispersive X-ray spectroscopy. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2023 Electronic address https://doi.org/10.1080/10420150.2022.2136085
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