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Influence of humidity on local polarization reversal in a Rb:KTP single crystal
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SYSNO ASEP 0561034 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Influence of humidity on local polarization reversal in a Rb:KTP single crystal Author(s) Shishkina, E.V. (RU)
Pelegova, E.V. (RU)
Kosobokov, M.S. (RU)
Akhmatkhanov, A.R. (RU)
Yudin, Petr (FZU-D) ORCID
Dejneka, Alexandr (FZU-D) RID, ORCID
Shur, V.Y. (RU)Number of authors 7 Source Title ACS Applied Electronic Materials. - : American Chemical Society
Roč. 3, č. 1 (2021), s. 260-266Number of pages 7 s. Language eng - English Country US - United States Keywords piezoresponse force microscopy ; conductive tip ; local polarization reversal ; humidity ; simulation ; ferroelectric domain ; domain growth Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Biophysics R&D Projects EF16_019/0000760 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Method of publishing Limited access Institutional support FZU-D - RVO:68378271 UT WOS 000613935300023 EID SCOPUS 85099025222 DOI 10.1021/acsaelm.0c00834 Annotation The influence of the relative humidity on the domain growth during local switching by a conductive tip of a scanning probe microscope has been studied in Rb:KTP single crystals. The abnormal formation of the elongated hexagonal domains during the local switching in an axial-symmetric field has been attributed to the anisotropy of the domain wall velocity. The increase and subsequent decrease in a hexagonal domain aspect ratio as a function of the pulse duration for high humidity have been attributed to the influence of the high-resistivity water layer. We assume that the domain elongation by the fast walls is limited by the water layer representing the series resistance, which depends on the wall position, while the domain widening by the slow walls is limited by their mobility. The computer simulation of the spatial distribution of the electric field has demonstrated that the appearance of a water meniscus decreases the field close to the tip and increases it far from the tip.
Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2023 Electronic address https://doi.org/10.1021/acsaelm.0c00834
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