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Effect of medium energy He.sup.+./sup., Ne.sup.+./sup. and Ar.sup.+./sup. ion irradiation on the Hf-In-C thin film composites

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    SYSNO ASEP0557032
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleEffect of medium energy He+, Ne+ and Ar+ ion irradiation on the Hf-In-C thin film composites
    Author(s) Cannavó, Antonino (UJF-V) ORCID, SAI
    Vacík, Jiří (UJF-V) RID, ORCID, SAI
    Bakardjieva, Snejana (UACH-T) SAI, RID, ORCID
    Kupčík, Jaroslav (UACH-T) SAI, RID, ORCID
    Lavrentiev, Vasyl (UJF-V) RID, ORCID, SAI
    Ceccio, Giovanni (UJF-V) ORCID, RID, SAI
    Horák, Pavel (UJF-V) RID, ORCID
    Němeček, J. (CZ)
    Calcagno, L. (IT)
    Number of authors9
    Article number139052
    Source TitleThin Solid Films. - : Elsevier - ISSN 0040-6090
    Roč. 743, FEB (2022)
    Number of pages13 s.
    Publication formPrint - P
    Languageeng - English
    CountryCH - Switzerland
    KeywordsHafnium ; Indium ; Carbon ; Composite ; Ion radiation ; Ion tolerance ; Hardness
    OECD categoryNuclear related engineering
    R&D ProjectsEF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA18-21677S GA ČR - Czech Science Foundation (CSF)
    Research InfrastructureCANAM II - 90056 - Ústav jaderné fyziky AV ČR, v. v. i.
    Method of publishingLimited access
    Institutional supportUJF-V - RVO:61389005 ; UACH-T - RVO:61388980
    UT WOS000784446700001
    EID SCOPUS85122000442
    DOI10.1016/j.tsf.2021.139052
    AnnotationThin films of Hf-In-C ternary compounds were synthesized by a 2-step method consisting of a low-energy ion beam sputtering and thermal annealing. The radiation tolerance of the composites and the effects of irradiation by medium energy light and heavy ions (100 keV He+, 100 keV Ne+, and 200 keV Ar+) with an extreme fluence (10(17) ions/cm(2)) were analyzed by several methods: composition and profiling of elements by Rutherford Backscattering Spectroscopy and Nuclear Resonance Analysis, microstructure and surface morphology by High Resolution Transmission Electron Microscopy and Atomic Force Microscopy, and mechanical properties (elastic modulus and hardness) by nanoindentation.The study showed that the as-prepared Hf-In-C thin films form a mixture of different binary and ternary phases, including nanostructured Hf2InC, and oxides of metallic building elements. The irradiation with light ions (He+) had only a mild effect on the structure, composition, and mechanical properties of the composites. However, irradiation with heavy ions (Ne+, Ar+) led to a significant change in all monitored parameters and an overall collapse of the sample structure (especially for the Ar+ ions). It turned out that although thin Hf-In-C composites show to be highly tolerant to light ions, they have very limited resistivity to medium energy heavy ions.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2023
    Electronic addresshttps://doi.org/10.1016/j.tsf.2021.139052
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