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Image analysis algorithm for the verification of hexagonal symmetry in spherical nanostructures

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    SYSNO ASEP0556001
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleImage analysis algorithm for the verification of hexagonal symmetry in spherical nanostructures
    Author(s) Domonkos, M. (CZ)
    Jackivová, Rajisa (FZU-D)
    Pathó, A. (CZ)
    Number of authors3
    Article number111635
    Source TitleMicroelectronic Engineering. - : Elsevier - ISSN 0167-9317
    Roč. 251, Jan (2022)
    Number of pages10 s.
    Languageeng - English
    CountryNL - Netherlands
    Keywordsimage analysis ; nanosphere lithography ; defect detection ; hexagonal ordering ; scanning electron microscopy ; Python
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    OECD categoryElectrical and electronic engineering
    Research InfrastructureCzechNanoLab - 90110 - Vysoké učení technické v Brně
    Method of publishingLimited access
    Institutional supportFZU-D - RVO:68378271
    UT WOS000710177300002
    EID SCOPUS85118727388
    DOI10.1016/j.mee.2021.111635
    AnnotationVerification of ordering and symmetry is essential to enhance the nanofabrication process of periodic nano-structures. In this paper, we present the open-source software HEXI, which can detect circles and distinguish between perfect hexagonal ordering and defect configurations. The proposed user-friendly image analysis soft-ware (implemented in Python) consists of several stages. First, the algorithm identifies circular structures in microscopy (e.g., scanning electron microscopy, atomic force microscopy) images using the Canny edge detector and the Hough circle transform. Then, the detected circles are categorized as hexagonally ordered or non- hexagonally ordered (defects). This classification can be achieved using three different methods: variance in brightness (global or adaptive) and distance.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2023
    Electronic addresshttps://doi.org/10.1016/j.mee.2021.111635
Number of the records: 1  

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