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Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof
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SYSNO ASEP 0552955 Document Type P - Patent R&D Document Type Patent or other outcome protected by special legislation Title Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof Author(s) Nejdl, Jaroslav (FZU-D) RID, ORCID Year of issue 2021 Possible third party use of the result A - Pro využití výsledku jiným subjektem je vždy nutné nabytí licence Royalty requested A - Poskytovatel licence požaduje licenční poplatek Patent no. or utility model no. or industrial design no. US10914628B2 Date of the patent acceptance 09.02.2021 Name of the patent owner Fyzikální ústav AV ČR, v. v. i. Code of the issuer name US001 - United States Patent and Trademark Office (USPTO) Alexandria Current use A - Pouze udělený (dosud nevyužívaný) patent nebo patent využívaný jeho vlastníkem Language eng - English Keywords spectrometry ; beam intensity profile diagnostics ; XUV ; X-rays Subject RIV BL - Plasma and Gas Discharge Physics OECD category Fluids and plasma physics (including surface physics) R&D Projects EF16_019/0000789 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2018141 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support FZU-D - RVO:68378271 Annotation The present invention concerns an apparatus for spectral and intensity profile characterization comprising: a diffractive element a beam block (3) attached to the diffractive element, the beam block (3) being positioned so as to block the passage of the direct incoming beam (1) which is not incident on the diffractive element a device for translation of the beam block (3) and the diffractive element reflective element (4) fixed detector (5) positioned on the axis of the incoming beam (1). The invention also concerns use and a method thereof. Such a compact system provides application in the field of spectrometry and diagnostics of the beam intensity profile, especially in the area of XUV and soft X-rays.
Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2022 Electronic address https://worldwide.espacenet.com/patent/search/family/060327011/publication/US10914628B2?q=US10914628B2
Number of the records: 1