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The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements
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SYSNO ASEP 0551131 Document Type A - Abstract R&D Document Type O - Ostatní Title The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements Author(s) Konvalina, Ivo (UPT-D) RID, ORCID, SAI
Zouhar, Martin (UPT-D) ORCID, RID, SAI
Daniel, Benjamin (UPT-D) RID
Paták, Aleš (UPT-D) RID, ORCID, SAI
Piňos, Jakub (UPT-D) RID, ORCID, SAI
Frank, Luděk (UPT-D) RID, SAI, ORCID
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAISource Title Microscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276
Roč. 27, S1 (2021), s. 612-615Number of pages 4 s. Publication form Online - E Language eng - English Country US - United States Keywords time of flight spectrometer ; inelastic mean free path ; energy loss spectrum ; density functional theory Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Electrical and electronic engineering Institutional support UPT-D - RVO:68081731 DOI 10.1017/S1431927621002609 Annotation Both electron microscopy and spectroscopy are powerful tools to gain information about structure and properties of various materials. We have developed a unique ultra-high vacuum instrument capable of analyzing samples via transmitted electrons in two complementary modes. These two modes are a standard microscopic regime in the range of energies from 5 keV down to few eV and a time-of-flight (ToF) method. Standard ToF spectrometers operate in energy range above 500 eV and detect reflected electrons. Our new ToF spectrometer is able to operate with energies of incident electrons below 300 eV. It detects transmitted electrons since the drift tube and detector are conveniently located below the analyzed sample. In order to apply these methods and interpret corresponding results correctly, deep understanding of electron transport phenomena in solids is required. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2022 Electronic address https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/timeofflight-tof-analysis-of-transmitted-electrons-at-energies-of-hundred-of-ev-for-pure-elements/13DD7110753D4BB9830773B5B732F086
Number of the records: 1