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Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride
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SYSNO ASEP 0545328 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride Author(s) Tkachenko, V. (DE)
Lipp, V. (DE)
Buescher, M. (DE)
Capotondi, F. (IT)
Hoeppner, H. (DE)
Medvedev, Nikita (FZU-D) ORCID, RID
Pedersoli, E. (IT)
Prandolini, M.J. (DE)
Rossi, G.M. (DE)
Tavella, F. (US)
Toleikis, S. (DE)
Windeler, M. (US)
Ziaja, B. (PL)
Teubner, U. (DE)Number of authors 14 Article number 5203 Source Title Scientific Reports. - : Nature Publishing Group - ISSN 2045-2322
Roč. 11, č. 1 (2021)Number of pages 10 s. Language eng - English Country DE - Germany Keywords temporal diagnostics of FEL pulses ; optical properties of silicon nitride irradiated by XUV and soft X-ray Subject RIV BH - Optics, Masers, Lasers OECD category Fluids and plasma physics (including surface physics) R&D Projects LTT17015 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 000626140000031 EID SCOPUS 85102084539 DOI 10.1038/s41598-021-84677-w Annotation Spatially encoded measurements of transient optical transmissivity became a standard tool for temporal diagnostics of free-electron-laser (FEL) pulses, as well as for the arrival time measurements in X-ray pump and optical probe experiments. The modern experimental techniques can measure changes in optical coefficients with a temporal resolution better than 10 fs. Carrier transport within the material and out of its significantly decrease the number of carriers. This would strongly affect the transient optical properties, making the diagnostic measurement inaccurate. We analyze in detail the effects of those processes on the optical properties of XUV and soft X-ray irradiated Si3N4, on sub-picosecond timescales. Theoretical predictions are compared with the published results of two experiments at FERMI and LCLS facilities, and with our own recent measurement. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2022 Electronic address http://hdl.handle.net/11104/0322052
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