Number of the records: 1  

Beam shaping and probe characterization in the scanning electron microscope

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    SYSNO ASEP0543063
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleBeam shaping and probe characterization in the scanning electron microscope
    Author(s) Řiháček, Tomáš (UPT-D) RID, ORCID
    Horák, M. (CZ)
    Schachinger, T. (AT)
    Mika, Filip (UPT-D) RID, SAI, ORCID
    Matějka, Milan (UPT-D) RID, ORCID, SAI
    Krátký, Stanislav (UPT-D) RID, ORCID, SAI
    Fořt, Tomáš (UPT-D) RID, ORCID, SAI
    Radlička, Tomáš (UPT-D) RID, ORCID, SAI
    Johnson, C. W. (US)
    Novák, L. (CZ)
    Seďa, B. (CZ)
    McMorran, B.J. (US)
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Number of authors13
    Article number113268
    Source TitleUltramicroscopy. - : Elsevier - ISSN 0304-3991
    Roč. 225, June (2021)
    Number of pages9 s.
    Publication formPrint - P
    Languageeng - English
    CountryNL - Netherlands
    KeywordsElectron diffraction ; SEM ; Electron beam structuring ; Spot shape measurement ; Electron vortex beam
    Subject RIVBF - Elementary Particles and High Energy Physics
    OECD categoryParticles and field physics
    R&D ProjectsTN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Method of publishingOpen access
    Institutional supportUPT-D - RVO:68081731
    UT WOS000649633800002
    EID SCOPUS85104406836
    DOI10.1016/j.ultramic.2021.113268
    AnnotationHere we demonstrate the use of nanofabricated grating holograms to diffract and shape electrons in a scanning electron microscope. The diffraction grating is placed in an aperture in the column. The entire diffraction pattern can be passed through the objective lens and projected onto the specimen, or an intermediate aperture can be used to select particular diffracted beams. We discuss several techniques for characterizing the diffraction pattern. The grating designs can incorporate features that can influence the phase and intensity of the diffracted SEM probe. We demonstrate this by producing electron vortex beams.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2022
    Electronic addresshttps://www.sciencedirect.com/science/article/pii/S0304399121000589
Number of the records: 1  

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