Number of the records: 1  

Possibilities of laser recrystallization and laser ablation in thin-layer structures based on a-Si:H

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    SYSNO ASEP0540759
    Document TypeA - Abstract
    R&D Document TypeO - Ostatní
    TitlePossibilities of laser recrystallization and laser ablation in thin-layer structures based on a-Si:H
    Author(s) Stuchlík, Jiří (FZU-D) RID, ORCID
    Stuchlíková, The-Ha (FZU-D) RID, ORCID
    Fajgar, Radek (UCHP-M) RID, ORCID, SAI
    Kupčík, Jaroslav (FZU-D) ORCID
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Number of authors5
    Source TitleOnline, 2020
    Number of pages22 s.
    Action4th BIATRI Workshop
    Event date09.12.2020 - 10.12.2020
    VEvent locationOnline
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    KeywordsCVD ; thin films ; a-Si:H ; nanoparticles
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    Subject RIV - cooperationInstitute of Chemical Process Fundamentals - Solid Matter Physics ; Magnetism
    R&D ProjectsLM2018110 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GC19-02858J GA ČR - Czech Science Foundation (CSF)
    EF16_019/0000760 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportFZU-D - RVO:68378271 ; UCHP-M - RVO:67985858
    AnnotationOur goal is to enhance optoelectronic properties and light conversion efficiency in hydrogenated silicon thin films by in-situ embedded nanoparticles using radio frequency chemical vapor deposition (RF CVD) combined with other methods such as molecular beam epitaxy, magnetron sputtering, Langmuir/Blodgett method, reactive deposition epitaxy, laser surface treatment, laser ablation, reactive laser ablation, vacuum evaporation and plasma treatment.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2021
Number of the records: 1  

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