Electron vortex beams in the scanning electron microscope

Řiháček, Tomáš; Horák, M.; Schachinger, T.; Mika, Filip; Matějka, Milan; Fořt, Tomáš; Radlička, Tomáš; Novák, L.; Seďa, B.; McMorran, B.J.; Béché, A.; Verbeeck, J.; Müllerová, Ilona

Number of the records: 1

Electron vortex beams in the scanning electron microscope

1.

SYSNO ASEP	0540306
Document Type	A - Abstract
R&D Document Type	The record was not marked in the RIV
R&D Document Type	Není vybrán druh dokumentu
Title	Electron vortex beams in the scanning electron microscope
Author(s)	Řiháček, Tomáš (UPT-D)_{RID, ORCID} Horák, M. (CZ) Schachinger, T. (AT) Mika, Filip (UPT-D)_{RID, SAI, ORCID} Matějka, Milan (UPT-D)_{RID, ORCID, SAI} Fořt, Tomáš (UPT-D)_{RID, ORCID, SAI} Radlička, Tomáš (UPT-D)_{RID, ORCID, SAI} Novák, L. (CZ) Seďa, B. (CZ) McMorran, B.J. (US) Béché, A. (BE) Verbeeck, J. (BE) Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID}
Number of authors	13
Source Title	Microscopy 2020. - Praha : Československá mikroskopická společnost, 2020 S. 42
Number of pages	1 s.
Publication form	Print - P
Action	Microscopy 2020
Event date	06.10.2020 - 07.10.2020
VEvent location	Lednice
Country	CZ - Czech Republic
Event type	EUR
Language	eng - English
Country	CZ - Czech Republic
Keywords	electron vortex beams ; SEM
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
OECD category	Electrical and electronic engineering
R&D Projects	TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
Institutional support	UPT-D - RVO:68081731
Annotation	Beam shaping in the (scanning) transmission electron microscope ((S)TEM) has been developingin the past decade as a tool for extending analytical abilities of conventional microscopes. A specific application of the beam sculpturing are electron vortex beams (EVBs). They were introduced in 2007 and experimentally realized in 2010. These beams, characterized by a well-defined orbital angular momentum in a direction of propagation, have been demonstrated as a tool for chiral energy-loss spectroscopy, probing surface plasmon properties or manipulating with nanoparticles. So far, all these experiments have been performed solely in the (S)TEM, where a detection of the probe current density distribution is quite straightforward. On the other hand, such a probecharacterization is rather challenging in the scanning electron microscope (SEM).
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2021

Number of the records: 1