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Wide-range tracking and LET-spectra of energetic light and heavy charged particles

SYSNO ASEP	0539472
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Wide-range tracking and LET-spectra of energetic light and heavy charged particles
Author(s)	Granja, C. (CZ) Oancea, C. (CZ) Jakoubek, J. (CZ) Marek, L. (CZ) Benton, E. (US) Kodaira, S. (JP) Miller, J. (US) Rucinski, A. (PL) Gajewski, J. (PL) Stasica, P. (PL) Zach, Václav (UJF-V)_{SAI, ORCID} Štursa, Jan (UJF-V)_{RID, ORCID} Chvátil, David (UJF-V)_{RID, SAI, ORCID} Krist, Pavel (UJF-V)_{RID, ORCID, SAI}
Number of authors	14
Article number	164901
Source Title	Nuclear Instruments & Methods in Physics Research Section A. - : Elsevier - ISSN 0168-9002 Roč. 988, FEB (2021)
Number of pages	12 s.
Publication form	Print - P
Language	eng - English
Country	NL - Netherlands
Keywords	particle tracking ; linear-energy-transfer ; charged particle detection ; semiconductor pixel detectors ; space radiation ; active nuclear emulsion
Subject RIV	JF - Nuclear Energetics
OECD category	Nuclear related engineering
R&D Projects	LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Research Infrastructure	CANAM II - 90056 - Ústav jaderné fyziky AV ČR, v. v. i.
Method of publishing	Limited access
Institutional support	UJF-V - RVO:61389005
UT WOS	000604627500016
EID SCOPUS	85097341986
DOI	10.1016/j.nima.2020.164901
Annotation	We developed a highly-selective technique to measure the energy loss and linear-energy-transfer (LET) spectra of energetic charged particles in high-resolution and over a large collection of particle-event types. Precise and wide-range spectral and tracking measurements were performed with a single semiconductor pixel detector. The quantum-counting sensitivity, high-granularity and per-pixel spectrometric response of the Timepix ASIC chip enable the detailed spectral-tracking registration of single charged particles across the detector semiconductor sensor. Both the deposited energy along the particle trajectory (energy loss) and the path length of the particle track across the semiconductor sensor are precisely measured for each particle. This allows for the determination of the particle LET in silicon in high accuracy and over a wide-range of energies, particle types and directions. The tracking and energy loss response together with the resolving power at the particle-event level make it possible to selectively provide LET distributions of the light and heavy charged particle components in mixed-radiation and omnidirectional fields. This technique applies to energetic (E > 10 MeV/u) charged particles generating tracks greater than the pixel size and incident at nonperpendicular direction (>20 degrees) to the sensor plane. The technique applies also to electrons of energy above few MeV as well as highly energetic and minimum-ionizing-particles (MIPs). We make use of existing and in part newly collected data at well-defined radiation fields with proton and light ion beam accelerators. Flexible measurements, ease of deployment and online response are possible by the use of compact readout electronics such as the miniaturized radiation camera MiniPix (size < 8 cm, weight < 50 g) operable by any PC. Results are given for protons and light ions (He, C) of selected energies above 10 MeV/u and directions (2 pi FoV). We include also electrons (20 MeV). Selective and detailed LET spectra are produced over a wide range (10(-1) to 102 keV/mu m) in silicon.
Workplace	Nuclear Physics Institute
Contact	Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
Year of Publishing	2022
Electronic address	https://doi.org/10.1016/j.nima.2020.164901

Number of the records: 1