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Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation

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    SYSNO ASEP0539468
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleMulti-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation
    Author(s) Mikšová, Romana (UJF-V) RID, ORCID
    Jagerová, Adéla (UJF-V) ORCID
    Malinský, Petr (UJF-V) RID, ORCID
    Harcuba, P. (CZ)
    Veselý, J. (CZ)
    Holý, V. (CZ)
    Kentsch, U. (DE)
    Macková, Anna (UJF-V) RID, ORCID
    Number of authors8
    Article number109773
    Source TitleVacuum. - : Elsevier - ISSN 0042-207X
    Roč. 184, FEB (2021)
    Number of pages11 s.
    Publication formPrint - P
    Languageeng - English
    CountryGB - United Kingdom
    KeywordsAg-ion implantation ; Yttria-stabilised zirconia ; damage accumulation ; strain relaxation ; nanoparticles
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    OECD categoryMaterials engineering
    R&D ProjectsLM2015056 GA MŠk - Ministry of Education, Youth and Sports (MEYS)
    GA18-03346S GA ČR - Czech Science Foundation (CSF)
    Method of publishingLimited access
    Institutional supportUJF-V - RVO:61389005
    UT WOS000604850800002
    EID SCOPUS85091829122
    DOI10.1016/j.vacuum.2020.109773
    AnnotationThe paper reports on implantation damage accumulation, Ag distribution and the interior morphology in different crystallographic orientations of implanted samples of cubic yttria-stabilised zirconia (YSZ). (100)-, (110)- and (111)-oriented YSZ was implanted with 400-keV Ag+ ions at ion fluences from 5 x 10(14) to 5 x 10(16) cm(-2). Rutherford backscattering spectrometry (RBS) in the channelling mode (RBS-C), as well as X-ray diffraction (XRD), were used for the quantitative measurement of the lattice disorder and Ag distribution. The defect propagation and Ag accumulation were observed using transmission electron microscopy (TEM) with the energy-dispersive X-ray spectroscopy (EDX). Although similar damage evolution trends were observed along with all channelling directions, the disorder accumulation is lower along the 110 direction than along the 100 and 111 direction. The damage extends much deeper than the theoretically predicted depths. It is attributed to long-range defect migration effects, confirmed by TEM. At the ion fluence of 5 x 10(16) cm(-2), nanometre-sized Ag precipitates were identified in the depth of 30-130 nm based on the Ag concentration-depth profiles determined by RBS.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 ; Renata Glasová, glasova@ujf.cas.cz, Tel.: 266 177 223
    Year of Publishing2022
    Electronic addresshttps://doi.org/10.1016/j.vacuum.2020.109773
Number of the records: 1