Number of the records: 1

Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation

SYSNO ASEP	0539468
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Multi-direction channelling study of the Ag:YSZ nanocomposites prepared by ion implantation
Author(s)	Mikšová, Romana (UJF-V)_{RID, ORCID, SAI} Jagerová, Adéla (UJF-V)_{ORCID, SAI} Malinský, Petr (UJF-V)_{RID, ORCID, SAI} Harcuba, P. (CZ) Veselý, J. (CZ) Holý, V. (CZ) Kentsch, U. (DE) Macková, Anna (UJF-V)_{RID, ORCID, SAI}
Number of authors	8
Article number	109773
Source Title	Vacuum. - : Elsevier - ISSN 0042-207X Roč. 184, FEB (2021)
Number of pages	11 s.
Publication form	Print - P
Language	eng - English
Country	GB - United Kingdom
Keywords	Ag-ion implantation ; Yttria-stabilised zirconia ; damage accumulation ; strain relaxation ; nanoparticles
Subject RIV	BG - Nuclear, Atomic and Molecular Physics, Colliders
OECD category	Materials engineering
R&D Projects	LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	GA18-03346S GA ČR - Czech Science Foundation (CSF)
Method of publishing	Limited access
Institutional support	UJF-V - RVO:61389005
UT WOS	000604850800002
EID SCOPUS	85091829122
DOI	10.1016/j.vacuum.2020.109773
Annotation	The paper reports on implantation damage accumulation, Ag distribution and the interior morphology in different crystallographic orientations of implanted samples of cubic yttria-stabilised zirconia (YSZ). (100)-, (110)- and (111)-oriented YSZ was implanted with 400-keV Ag+ ions at ion fluences from 5 x 10(14) to 5 x 10(16) cm(-2). Rutherford backscattering spectrometry (RBS) in the channelling mode (RBS-C), as well as X-ray diffraction (XRD), were used for the quantitative measurement of the lattice disorder and Ag distribution. The defect propagation and Ag accumulation were observed using transmission electron microscopy (TEM) with the energy-dispersive X-ray spectroscopy (EDX). Although similar damage evolution trends were observed along with all channelling directions, the disorder accumulation is lower along the 110 direction than along the 100 and 111 direction. The damage extends much deeper than the theoretically predicted depths. It is attributed to long-range defect migration effects, confirmed by TEM. At the ion fluence of 5 x 10(16) cm(-2), nanometre-sized Ag precipitates were identified in the depth of 30-130 nm based on the Ag concentration-depth profiles determined by RBS.
Workplace	Nuclear Physics Institute
Contact	Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
Year of Publishing	2022
Electronic address	https://doi.org/10.1016/j.vacuum.2020.109773

Number of the records: 1