Number of the records: 1  

Growth defects in WC:H layers for tribological applications

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    SYSNO ASEP0539174
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleGrowth defects in WC:H layers for tribological applications
    Author(s) Mates, Tomáš (FZU-D) RID, ORCID
    Polášek, J. (CZ)
    Mareš, P. (CZ)
    Dubau, M. (CZ)
    Vetushka, Aliaksi (FZU-D) RID, ORCID
    Ledinský, Martin (FZU-D) RID, ORCID, SAI
    Fejfar, Antonín (FZU-D) RID, ORCID, SAI
    Vyskočil, J. (CZ)
    Number of authors8
    Article number109372
    Source TitleVacuum. - : Elsevier - ISSN 0042-207X
    Roč. 178, Aug (2020), s. 1-7
    Number of pages7 s.
    Languageeng - English
    CountryGB - United Kingdom
    KeywordsDLC ; PACVD ; AFM ; SEM ; FIB ; Raman
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    R&D ProjectsEF16_026/0008382 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2018110 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    TH03020004 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Method of publishingLimited access
    Institutional supportFZU-D - RVO:68378271
    UT WOS000541439800003
    EID SCOPUS85085735198
    DOI10.1016/j.vacuum.2020.109372
    AnnotationFriction and wear resistance are important factors of all mechanical tools and machines used in industry. Diamond-like carbon (DLC) and derived metal-carbon composite (WC:H) layers are known to substantially improve both of these factors and frequently find their use in tribological applications. Microscopic analysis of the WC:H layers shows a frequent occurrence of a certain type of structural defects that have major influence on the layer roughness. The defects are conically shaped objects penetrating the layer all the way down to the substrate, covered with a spherical cap on the top. The lateral dimensions of the defects vary from ~100 nm to ~1 um. To study these defects we prepared several layers at various conditions and analysed them by SEM, FIB, EDX, AFM and Raman spectroscopy. We will discuss the structure of the defects and influence of the preparation conditions on their growth and on their occurence in the layer.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2021
    Electronic addresshttps://doi.org/10.1016/j.vacuum.2020.109372
Number of the records: 1  

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