Number of the records: 1  

Very Low Energy Electron Transmission Spectroscopy of 2D Materials

  1. 1.
    SYSNO ASEP0536755
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JOstatní články
    TitleVery Low Energy Electron Transmission Spectroscopy of 2D Materials
    Author(s) Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Daniel, Benjamin (UPT-D) RID
    Zouhar, Martin (UPT-D) ORCID, RID, SAI
    Paták, Aleš (UPT-D) RID, ORCID, SAI
    Piňos, Jakub (UPT-D) RID, ORCID, SAI
    Radlička, Tomáš (UPT-D) RID, ORCID, SAI
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Materna-Mikmeková, Eliška (UPT-D)
    Number of authors9
    Source TitleMicroscopy and Microanalysis, S2. - Cambridge : Microscopy Society of America, 2020 - ISSN 1431-9276
    Roč. 26, S2 (2020), s. 2636-2638
    Number of pages3 s.
    Publication formPrint - P
    Languageeng - English
    CountryUS - United States
    Keywordsspectroscopy ; very low energy electron transmission ; 2D materials
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    OECD categoryElectrical and electronic engineering
    R&D ProjectsTN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Method of publishingOpen access
    Institutional supportUPT-D - RVO:68081731
    AnnotationDetailed knowledge of mechanisms of electron scattering and its practical consequences for very low energies are of prime importance for not only measurement techniques but also for development of newmaterials for electronic devices of the next generation. Low thickness of 2D materials motivated us to develop unique device analyzing samples via transmitted electrons in a standard microscopic regime and also via time-of-flight (ToF) spectroscopic method.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2021
    Electronic address
Number of the records: 1  

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