Number of the records: 1  

Modification of structure and surface morphology in various ZnO facets via low fluence gold swift heavy ion irradiation

  1. 1.
    SYSNO ASEP0536516
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleModification of structure and surface morphology in various ZnO facets via low fluence gold swift heavy ion irradiation
    Author(s) Jagerová, Adéla (UJF-V) ORCID, SAI
    Malinský, Petr (UJF-V) RID, ORCID, SAI
    Mikšová, Romana (UJF-V) RID, ORCID, SAI
    Lalik, Ondřej (UJF-V) SAI
    Cutroneo, Mariapompea (UJF-V) ORCID, RID, SAI
    Romanenko, Oleksandr V. (UJF-V) ORCID, SAI
    Szokolova, K. (CZ)
    Sofer, Z. (CZ)
    Slepička, P. (CZ)
    Čízek, J. (CZ)
    Macková, Anna (UJF-V) RID, ORCID, SAI
    Number of authors11
    Source TitleSurface and Interface Analysis. - : Wiley - ISSN 0142-2421
    Roč. 53, č. 2 (2021), s. 230-243
    Number of pages14 s.
    Publication formPrint - P
    Languageeng - English
    CountryUS - United States
    Keywordssingle ion irradiation ; swift heavy-ion irradiation ; ZnO nanostructuring
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    OECD categoryAtomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
    R&D ProjectsLM2015056 GA MŠk - Ministry of Education, Youth and Sports (MEYS)
    EF16_013/0001812 GA MŠk - Ministry of Education, Youth and Sports (MEYS)
    GA18-03346S GA ČR - Czech Science Foundation (CSF)
    Method of publishingLimited access
    Institutional supportUJF-V - RVO:61389005
    UT WOS000585037100001
    EID SCOPUS85094198191
    AnnotationThe influence of low fluence high-energy ion irradiation on the modification of the ZnO surface structure and optical properties has been studied. ZnO samples of various orientations, namely, c-plane (0001), a-plane (11-20) and m-plane (10-10), have been implanted with 30-MeV Au ions with fluences ranging from 5 x 10(9) to 5 x 10(11) cm(-2). Rutherford backscattering spectrometry in the channelling mode (RBS-C) and Raman spectroscopy has shown the distinct damage accumulation in the irradiated surface layer about 1 mu m depending on the ZnO facet being to larger extent evidenced in the m-plane ZnO. Contrary, the a-plane ZnO has been exhibited the lowest Zn disorder. Using atomic force microscopy (AFM), a complex morphology was detected on the irradiated samples containing grains and exhibiting increased roughness, both growing with the Au implantation fluence mainly in m-plane ZnO. Positron annihilation spectroscopy (PAS) has shown distinct defect accumulation at the Au-ion fluence of 5 x 10(11) cm(-2), where RBS-C and Raman spectroscopy indicated sudden disorder increase in the irradiated layers, probably the creation of more complex clusters of Zn and O vacancies 4VZn + 8VO initiated in connection with an overlap of individual ion impacts. Photoluminescence measurements have shown a distinct near-band-edge (NBE) luminescence, developing with the increasing Au-ion fluence in various ZnO orientations. The m-plane ZnO had the most progressively suppressed NBE in comparison with the other orientations.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová,, Tel.: 266 173 228
    Year of Publishing2022
    Electronic address
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.