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Optical characterization of poly-SiO.sub.x./sub. and poly-SiC.sub.x./sub. carrier-selective passivating contacts
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SYSNO ASEP 0536214 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Optical characterization of poly-SiOx and poly-SiCx carrier-selective passivating contacts Author(s) Singh, M. (NL)
Santbergen, R. (NL)
Mazzarella, L. (NL)
Madrampazakis, A. (NL)
Yang, G. (NL)
Vismara, R. (NL)
Remeš, Zdeněk (FZU-D) RID, ORCID
Weeber, A. (NL)
Zeman, M. (NL)
Isabella, O. (NL)Number of authors 10 Article number 110507 Source Title Solar Energy Materials and Solar Cells. - : Elsevier - ISSN 0927-0248
Roč. 210, Jun (2020), s. 1-11Number of pages 11 s. Language eng - English Country NL - Netherlands Keywords carrier-selective passivating contacts ; absorption coefficients ; photothermal deflection spectroscopy ; reflection-transmission ; poly-SiOx ; poly-SiCx Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 000528198800024 EID SCOPUS 85082039242 DOI 10.1016/j.solmat.2020.110507 Annotation The optical modelling for optimizing high-efficiency c-Si solar cells endowed with poly-SiOx or poly-SiCx carrierselective passivating contacts (CSPCs) demands a thorough understanding of their optical properties, especially their absorption coefficient. Due to the mixed phase nature of these CSPCs, spectroscopic ellipsometry is unable to accurately detect the weak free carrier absorption (FCA) at long wavelengths. In this work, the absorption coefficient of doped poly-SiOx and poly-SiCx layers as function of oxygen and carbon content, respectively, was obtained for wavelengths (300–2000 nm) by means of two alternative techniques. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2021 Electronic address http://hdl.handle.net/11104/0314032
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