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Optical characterization of poly-SiO.sub.x./sub. and poly-SiC.sub.x./sub. carrier-selective passivating contacts

  1. 1.
    SYSNO ASEP0536214
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleOptical characterization of poly-SiOx and poly-SiCx carrier-selective passivating contacts
    Author(s) Singh, M. (NL)
    Santbergen, R. (NL)
    Mazzarella, L. (NL)
    Madrampazakis, A. (NL)
    Yang, G. (NL)
    Vismara, R. (NL)
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Weeber, A. (NL)
    Zeman, M. (NL)
    Isabella, O. (NL)
    Number of authors10
    Article number110507
    Source TitleSolar Energy Materials and Solar Cells. - : Elsevier - ISSN 0927-0248
    Roč. 210, Jun (2020), s. 1-11
    Number of pages11 s.
    Languageeng - English
    CountryNL - Netherlands
    Keywordscarrier-selective passivating contacts ; absorption coefficients ; photothermal deflection spectroscopy ; reflection-transmission ; poly-SiOx ; poly-SiCx
    Subject RIVBM - Solid Matter Physics ; Magnetism
    OECD categoryCondensed matter physics (including formerly solid state physics, supercond.)
    Method of publishingOpen access
    Institutional supportFZU-D - RVO:68378271
    UT WOS000528198800024
    EID SCOPUS85082039242
    DOI10.1016/j.solmat.2020.110507
    AnnotationThe optical modelling for optimizing high-efficiency c-Si solar cells endowed with poly-SiOx or poly-SiCx carrierselective passivating contacts (CSPCs) demands a thorough understanding of their optical properties, especially their absorption coefficient. Due to the mixed phase nature of these CSPCs, spectroscopic ellipsometry is unable to accurately detect the weak free carrier absorption (FCA) at long wavelengths. In this work, the absorption coefficient of doped poly-SiOx and poly-SiCx layers as function of oxygen and carbon content, respectively, was obtained for wavelengths (300–2000 nm) by means of two alternative techniques.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2021
    Electronic addresshttp://hdl.handle.net/11104/0314032
Number of the records: 1  

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