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Microcapacitors on graphene oxide and synthetic polymers prepared by microbeam lithography

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    SYSNO ASEP0534240
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleMicrocapacitors on graphene oxide and synthetic polymers prepared by microbeam lithography
    Author(s) Malinský, Petr (UJF-V) RID, ORCID, SAI
    Romanenko, Oleksandr V. (UJF-V) ORCID, SAI
    Havránek, Vladimír (UJF-V) RID, SAI, ORCID
    Stammers, James H. (UJF-V)
    Hnatowicz, Vladimír (UJF-V) RID
    Cutroneo, Mariapompea (UJF-V) ORCID, RID, SAI
    Novák, Josef (UJF-V) ORCID
    Slepička, P. (CZ)
    Svorčík, V. (CZ)
    Szokolova, K. (CZ)
    Bouša, D. (CZ)
    Sofer, Z. (CZ)
    Macková, Anna (UJF-V) RID, ORCID, SAI
    Number of authors13
    Article number146802
    Source TitleApplied Surface Science. - : Elsevier - ISSN 0169-4332
    Roč. 528, OCT (2020)
    Number of pages11 s.
    Publication formPrint - P
    Languageeng - English
    CountryNL - Netherlands
    KeywordsPolymers ; Graphene oxide ; ion-beam writing ; chemical properties ; microcapacitors
    Subject RIVJJ - Other Materials
    OECD categoryCoating and films
    R&D ProjectsGA19-02482S GA ČR - Czech Science Foundation (CSF)
    EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Method of publishingLimited access
    Institutional supportUJF-V - RVO:61389005
    UT WOS000576739600009
    EID SCOPUS85086823551
    DOI10.1016/j.apsusc.2020.146802
    AnnotationCarbon-ion microbeam writing was employed for the mask-less production of microscale capacitors in insulating graphene oxide (GO), polyimide (PI) and poly(methyl-methacrylate) (PMMA) foils. The substrates were irradiated by a 5 MeV C beams with micrometer-scale resolution to create conducive strips. The morphology and quality of the created microstructures and compositional changes in the host matrix under the ion microbeam irradiation were studied using scanning electron microscopy and energy-dispersive X-ray spectroscopy. The changes in the structure and elemental composition of the irradiated areas were characterised by Raman microspectroscopy, X-ray photoelectron spectroscopy, Rutherford backscattering spectroscopy and elastic recoil detection analysis. The microcapacitors with the highest capacitance (in the order of pF) were those prepared on the GO surface. On the other hand, in PI and PMMA, the same carbon-ion irradiation does not induce such a significant enhancement of electric properties and the capacity of the resulting capacitor-like structures is substantially lower.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2021
    Electronic addresshttps://doi.org/10.1016/j.apsusc.2020.146802
Number of the records: 1  

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