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Soft X-ray laser ablation for nano-scale chemical mapping microanalysis
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SYSNO ASEP 0533630 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Soft X-ray laser ablation for nano-scale chemical mapping microanalysis Author(s) Bleiner, D. (CH)
Juha, Libor (FZU-D) RID, ORCID, SAI
Qu, D. (CH)Number of authors 3 Source Title Journal of Analytical Atomic Spectrometry. - : Royal Society of Chemistry - ISSN 0267-9477
Roč. 35, č. 6 (2020), s. 1051-1070Number of pages 20 s. Language eng - English Country GB - United Kingdom Keywords laser ablation ; soft X-ray laser ; laser-assisted microanalysis ; nano-scale chemical mapping microanalysis Subject RIV BH - Optics, Masers, Lasers OECD category Optics (including laser optics and quantum optics) Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 000544032100003 EID SCOPUS 85091331230 DOI 10.1039/c9ja00366e Annotation Laser-assisted microanalysis offers the advantage of determining the spatially resolved compositions in 3D. Scanning a material with a sequence of sampling laser pulses and acquiring online the related spectra allow one to map the lateral and depth distribution of elements and molecules. Disruptive improvements in laser technology are demonstrated utilizing recently self-developed extreme ultraviolet or soft X-ray lasers. A significant enhancement of the resolution is accomplished thanks to a much shorter wavelength, with respect to state-of-the-art commercial lasers. As the most innovative aspect, the sampling efficiency is enhanced using “ionizing radiation”, i.e. directly activating the target material. The analytical setup is simplified to a sampling source and detector, i.e. without the need for a secondary ionization or excitation source as in some state-of-the-art analytical systems.
Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2021 Electronic address https://doi.org/10.1039/c9ja00366e
Number of the records: 1