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Comparison of GO and polymer microcapacitors prepared by ion beam writing

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    SYSNO ASEP0525636
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleComparison of GO and polymer microcapacitors prepared by ion beam writing
    Author(s) Malinský, Petr (UJF-V) RID, ORCID, SAI
    Romanenko, Oleksandr V. (UJF-V) ORCID, SAI
    Havránek, Vladimír (UJF-V) RID, SAI, ORCID
    Hnatowicz, Vladimír (UJF-V) RID
    Stammers, James H. (UJF-V)
    Cutroneo, Mariapompea (UJF-V) ORCID, RID, SAI
    Novák, Josef (UJF-V) ORCID
    Slepička, P. (CZ)
    Švorčík, V. (CZ)
    Szokolova, K. (CZ)
    Bouša, D. (CZ)
    Sofer, Z. (CZ)
    Macková, Anna (UJF-V) RID, ORCID, SAI
    Number of authors13
    Source TitleSurface and Interface Analysis. - : Wiley - ISSN 0142-2421
    Roč. 52, č. 12 (2020), s. 1171-1177
    Number of pages7 s.
    Publication formPrint - P
    Languageeng - English
    CountryUS - United States
    Keywordschemical properties ; graphene oxide ; ion beam writing ; microcapacitors ; PMMA
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    OECD categoryAtomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
    R&D ProjectsGA19-02482S GA ČR - Czech Science Foundation (CSF)
    LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Method of publishingLimited access
    Institutional supportUJF-V - RVO:61389005
    UT WOS000544050300001
    EID SCOPUS85087206964
    DOI10.1002/sia.6851
    AnnotationCarbon beam writing was employed as a method for maskless production of microscale capacitors in both insulating graphene oxide (GO) and poly(methyl methacrylate) (PMMA) matrix. The GO and PMMA foils were irradiated using a 5-MeV C(3+)beam with micrometer scale resolution. As follows, the shape of the created microstructures and compositional changes was studied using the scanning electron microscopy/energy-dispersive X-ray spectroscopy method (SEM/EDS). The structural and compositional progression was characterized by Raman spectroscopy, Rutherford backscattering spectroscopy (RBS), and elastic recoil detection analysis (ERDA) spectroscopy. The improvement of the prepared structures' electrical properties was also studied, and it can be concluded that carbon irradiation leads to the removal of oxygen and hydrogen and to growth of the carbon domains, which is connected with the conductivity increase of the irradiated parts and capacitance of the final products in the order of pF.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2021
    Electronic addresshttps://doi.org/10.1002/sia.6851
Number of the records: 1  

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