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Ion, electron and laser beams for Cultural Heritage investigations by Czech-Italian collaboration
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SYSNO ASEP 0525007 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Ion, electron and laser beams for Cultural Heritage investigations by Czech-Italian collaboration Author(s) Torrisi, L. (IT)
Torrisi, Alfio (UJF-V) RID, ORCID
Havránek, Vladimír (UJF-V) RID, SAI, ORCID
Tomandl, Ivo (UJF-V) RID, ORCID, SAI
Silipigni, L. (IT)Number of authors 5 Article number C04050 Source Title Journal of Instrumentation. - : Institute of Physics Publishing - ISSN 1748-0221
Roč. 15, č. 4 (2020)Number of pages 20 s. Publication form Print - P Action Conference on Plasma Physics by Laser and Applications (PPLA) Event date 29.10.2019 - 31.10.2019 VEvent location Pisa Country IT - Italy Event type WRD Language eng - English Country GB - United Kingdom Keywords mass spectrometers ; X-ray detectors ; X-ray fluorescence (XRF) systems Subject RIV BG - Nuclear, Atomic and Molecular Physics, Colliders OECD category Nuclear physics R&D Projects LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) GA19-02482S GA ČR - Czech Science Foundation (CSF) EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Method of publishing Limited access Institutional support UJF-V - RVO:61389005 UT WOS 000534739900050 EID SCOPUS 85085258018 DOI 10.1088/1748-0221/15/04/C04050 Annotation An overview of physical investigations of cultural heritage samples using ion and laser beams performed in the frame of the international collaboration between the University of Messina (Italy) and the Nuclear Physics Institute-ASCR (Czech Republic) is presented. Solid samples are analysed in high vacuum using particle induced X-ray emission, Rutherford backscattering spectrometry, elastic recoil detection analysis, prompt gamma activation analysis, nuclear reaction analysis, laser ablation, mass spectrometry, scanning electron microscopy, and many more. The elemental composition of the sample, the trace elements, the depth profiles, the morphology and the comparison between samples and references are reported. Both electron and ion microbeams are employed to have details of the spatial distribution maps of elements of interest. Workplace Nuclear Physics Institute Contact Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228 Year of Publishing 2021 Electronic address https://doi.org/10.1088/1748-0221/15/04/C04050
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