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3D electron diffraction: the nanocrystallography revolution
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SYSNO ASEP 0522225 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title 3D electron diffraction: the nanocrystallography revolution Author(s) Gemmi, M. (IT)
Mugnaioli, E. (IT)
Gorelik, T.E. (DE)
Kolb, U. (DE)
Palatinus, Lukáš (FZU-D) RID, ORCID
Boullay, P. (FR)
Hovmoller, S. (SE)
Abrahams, J.P. (CH)Number of authors 8 Source Title ACS Central Science. - : American Chemical Society - ISSN 2374-7943
Roč. 5, č. 8 (2019), s. 1315-1329Number of pages 14 s. Language eng - English Country US - United States Keywords nanocrystalline materials ; electron diffraction ; 3D acquisition ; crystal structure Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) Method of publishing Open access Institutional support FZU-D - RVO:68378271 UT WOS 000486591500007 EID SCOPUS 85075945528 DOI 10.1021/acscentsci.9b00394 Annotation Crystallography of nanocrystalline materials has witnessed a true revolution in the past 10 years, thanks to the introduction of protocols for 3D acquisition and analysis of electron diffraction data. This method provides single-crystal data of structure solution and refinement quality, allowing the atomic structure determination of those materials that remained hitherto unknown because of their limited crystallinity. Several experimental protocols exist, which share the common idea of sampling a sequence of diffraction patterns while the crystal is tilted around a noncrystallographic axis, namely, the goniometer axis of the transmission electron microscope sample stage. This Outlook reviews most important 3D electron diffraction applications for different kinds of samples and problematics, related with both materials and life sciences. Structure refinement including dynamical scattering is also briefly discussed.
Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2020 Electronic address http://hdl.handle.net/11104/0306743
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