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Structural and compositional modification of graphene oxide by means of medium and heavy ion implantation

SYSNO ASEP	0520686
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Structural and compositional modification of graphene oxide by means of medium and heavy ion implantation
Author(s)	Malinský, Petr (UJF-V)_{RID, ORCID, SAI} Cutroneo, Mariapompea (UJF-V)_{ORCID, RID, SAI} Sofer, Z. (CZ) Szokolova, K. (CZ) Bottger, R. (DE) Akhmadaliev, S. (DE) Macková, Anna (UJF-V)_{RID, ORCID, SAI}
Number of authors	7
Source Title	Nuclear Instruments & Methods in Physics Research Section B. - : Elsevier - ISSN 0168-583X Roč. 460, č. 12 (2019), s. 201-208
Number of pages	8 s.
Publication form	Print - P
Action	28th International Conference on Atomic Collisions in Solids (ICACS) / 10th International Symposium on Swift Heavy Ions in Matter (SHIM)
Event date	01.07.2018 - 07.07.2018
VEvent location	Caen
Country	FR - France
Event type	WRD
Language	eng - English
Country	NL - Netherlands
Keywords	chemical properties ; electrical properties ; graphene oxide ; ion irradiation
Subject RIV	BG - Nuclear, Atomic and Molecular Physics, Colliders
OECD category	Nuclear related engineering
R&D Projects	LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	GA16-05167S GA ČR - Czech Science Foundation (CSF)
	EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Method of publishing	Limited access
Institutional support	UJF-V - RVO:61389005
UT WOS	000504510900038
EID SCOPUS	85063099323
DOI	10.1016/j.nimb.2019.03.022
Annotation	The ion irradiation fluences of 5.0 x 10(14) cm(-2), 5.0 x 10(15) cm(-2) and 5.0 x 10(16) cm(-2) were used. Upon irradiation, the modified GO foils were characterised using nuclear analytical methods Rutherford Backscattering Spectrometry (RBS), Elastic Recoil Detection Analysis (ERDA) and various conventional analytical methods such as Raman spectroscopy, Attenuated Total Reflectance Fourier Transform Infrared Spectroscopy (ATR-FTIR), X-ray Photoelectron Spectroscopy (XPS), and 2-point conductivity measurements. Oxygen species removal was evidenced as the increasing function of the ion implantation fluence and oxygen depth profiles exhibited complex behaviour connected to implanted ion specie. The deep oxygen depletion in the broad surface layer accompanied by Ga diffusion into the depth was observed in Ga irradiated GO compared to Au irradiated samples which exhibited a narrow oxygen depleted layer at GO surface. XPS evidenced strong increase of C=C bonds compared to C-O bonds on the irradiated GO surface with increasing ion fluence, which was comparable for both ion species. Raman spectroscopy shows the modification of main phonon modes identified in GO. The D peak slight decrease and broadening was observed for GO irradiated with ion fluence above 5 x 1015 cm(-2) and mainly for Au ion irradiation. FTIR analysis proved the oxygen containing functional group release with the increased ion fluence, mainly C-O group release after Au ion irradiation was observed. Simultaneously H-O stretching absorption peak is in FTIR spectrum reduced more significantly for Ga irradiated GO which is in accordance with RBS elemental analysis exhibiting the more pronounced hydrogen depletion. Electrical conductivity measurement shows the linear I-V characteristics for the GO irradiated using both ion species and all ion fluences, the surface layer exhibited conductive behaviour comparing to pristine GO non-linear I-V characteristics.
Workplace	Nuclear Physics Institute
Contact	Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
Year of Publishing	2020
Electronic address	https://doi.org/10.1016/j.nimb.2019.03.022

Number of the records: 1