Number of the records: 1  

Very Low Energy Electron Transmission Spectro-Microscopy

  1. 1.
    SYSNO ASEP0510315
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    R&D Document TypeNení vybrán druh dokumentu
    TitleVery Low Energy Electron Transmission Spectro-Microscopy
    Author(s) Daniel, Benjamin (UPT-D) RID
    Zouhar, Martin (UPT-D) ORCID, RID, SAI
    Radlička, Tomáš (UPT-D) RID, ORCID, SAI
    Piňos, Jakub (UPT-D) RID, ORCID, SAI
    Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAI
    Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Number of authors8
    Source TitleMicroscopy Conference: MC 2019. Abstracts. - Berlin : DSE, 2019
    S. 609-610
    Number of pages2 s.
    Publication formOnline - E
    ActionMicroscopy Conference : MC 2019
    Event date01.09.2019 - 05.09.2019
    VEvent locationBerlin
    CountryDE - Germany
    Event typeWRD
    Languageeng - English
    CountryDE - Germany
    Keywordsvery low energy ; electron transmission spectro-microscopy
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    OECD categoryElectrical and electronic engineering
    R&D ProjectsTN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportUPT-D - RVO:68081731
    AnnotationScanning Low Energy Electron Microscopy (SLEEM) is a technique that combines an ordinary (low voltage) SEM with a biased specimen stage to form a cathode lens. This allows for specimen imaging using electron energies below 50 eV, while retaining resolution on the nanometer scale.
    At such low energies, electron interaction with solids is changed and increased drastically in comparison to usual SEM
    with electron energies of at least several keV. The role of the atomic number for material contrast decreases, interactions of the electrons with the local density of states gain importance. As a result the mechanism of contrast formation in SLEEM is quite different and currently not well understood.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2020
Number of the records: 1  

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