Number of the records: 1  

Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy

  1. 1.
    SYSNO ASEP0510308
    Document TypeA - Abstract
    R&D Document TypeThe record was not marked in the RIV
    R&D Document TypeNení vybrán druh dokumentu
    TitleContamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy
    Author(s) Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAI
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Zhang, T. (US)
    Asefa, T. (US)
    Number of authors6
    Source TitleMicroscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276
    Roč. 25, S2 (2019), s. 500-501
    Number of pages2 s.
    Publication formPrint - P
    ActionMicroscopy & Microanalysis 2019 Meeting
    Event date04.08.2019 - 08.08.2019
    VEvent locationPortland
    CountryUS - United States
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsultra-low energy ; spectroscopy ; contamination mitigation strategy
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    OECD categoryNano-materials (production and properties)
    R&D ProjectsTN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    TG03010046 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportUPT-D - RVO:68081731
    DOI10.1017/S1431927619003234
    AnnotationPerhaps the most straightforward expectation related with ultra-low energy microscopy/spectroscopy is
    the low penetration of electrons into the samples. In general, low energy electrons cause more intense
    contamination than high energy electrons, which can be explained by diminution of the interaction
    volume of electrons inside the samples and increased yield of secondary electrons. Naturally, for a true
    “surface” study, the sample has to be perfectly clean and an in-situ cleaning method should be applied
    on the sample.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2020
Number of the records: 1  

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.