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Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy
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SYSNO ASEP 0510308 Document Type A - Abstract R&D Document Type The record was not marked in the RIV R&D Document Type Není vybrán druh dokumentu Title Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy Author(s) Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAI
Frank, Luděk (UPT-D) RID, SAI, ORCID
Konvalina, Ivo (UPT-D) RID, ORCID, SAI
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Zhang, T. (US)
Asefa, T. (US)Number of authors 6 Source Title Microscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276
Roč. 25, S2 (2019), s. 500-501Number of pages 2 s. Publication form Print - P Action Microscopy & Microanalysis 2019 Meeting Event date 04.08.2019 - 08.08.2019 VEvent location Portland Country US - United States Event type WRD Language eng - English Country US - United States Keywords ultra-low energy ; spectroscopy ; contamination mitigation strategy Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Nano-materials (production and properties) R&D Projects TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) TG03010046 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 DOI 10.1017/S1431927619003234 Annotation Perhaps the most straightforward expectation related with ultra-low energy microscopy/spectroscopy is
the low penetration of electrons into the samples. In general, low energy electrons cause more intense
contamination than high energy electrons, which can be explained by diminution of the interaction
volume of electrons inside the samples and increased yield of secondary electrons. Naturally, for a true
“surface” study, the sample has to be perfectly clean and an in-situ cleaning method should be applied
on the sample.Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2020
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