Number of the records: 1

Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons

SYSNO ASEP	0510307
Document Type	A - Abstract
R&D Document Type	The record was not marked in the RIV
R&D Document Type	Není vybrán druh dokumentu
Title	Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons
Author(s)	Konvalina, Ivo (UPT-D)_{RID, ORCID, SAI} Daniel, Benjamin (UPT-D)_RID Zouhar, Martin (UPT-D)_{ORCID, RID, SAI} Piňos, Jakub (UPT-D)_{RID, ORCID, SAI} Radlička, Tomáš (UPT-D)_{RID, ORCID, SAI} Frank, Luděk (UPT-D)_{RID, SAI, ORCID} Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Materna Mikmeková, Eliška (UPT-D)_{ORCID, RID, SAI}
Number of authors	8
Source Title	Microscopy and Microanalysis. - : Cambridge University Press - ISSN 1431-9276 Roč. 25, S2 (2019), s. 482-483
Number of pages	2 s.
Publication form	Print - P
Action	Microscopy & Microanalysis 2019 Meeting
Event date	04.08.2019 - 08.08.2019
VEvent location	Portland
Country	US - United States
Event type	WRD
Language	eng - English
Country	US - United States
Keywords	two-dimensional (2D) materials ; microscopy and spectroscopy ; low energy electrons
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
OECD category	Electrical and electronic engineering
R&D Projects	TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
Institutional support	UPT-D - RVO:68081731
DOI	10.1017/S1431927619003143
Annotation	Two-dimensional (2D) materials have recently become very popular because of their interesting properties and rich application potential. Progress in production of new high quality 2D materials necessitates to study and analyze these materials. Such studies can be performed via scanning electron microscopy with slow and very slow electrons and time-of-flight (ToF) spectroscopy.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2020

Number of the records: 1