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Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation
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SYSNO ASEP 0508216 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Experimental Measurement of Nanolayers via Electromagnetic, Near Infrared, and Gamma Radiation Author(s) Fiala, P. (CZ)
Bartušek, Karel (UPT-D) RID, ORCID, SAI
Dědková, J. (CZ)
Kadlec, R. (CZ)
Dohnal, P. (CZ)Number of authors 5 Source Title Measurement Science Review. - : Sciendo - ISSN 1335-8871
Roč. 19, č. 4 (2019), s. 144-152Number of pages 9 s. Publication form Print - P Language eng - English Country SK - Slovakia Keywords nanomaterials ; multilayered material ; resonance ; periodic system ; electromagnetic wave ; X-ray ; gamma-ray ; antireflection ; shielding Subject RIV BH - Optics, Masers, Lasers OECD category Nuclear physics Method of publishing Open access Institutional support UPT-D - RVO:68081731 UT WOS 000482557900002 DOI 10.2478/msr-2019-0020 Annotation We discuss and compare the results obtained from experimental measurements of a two-layer, Ni and TiO2 nanometric structure deposited on siliceous glass. Utilizing previous theoretical models of multilayers or periodic systems and their verifications, the paper focuses on measurement in the NIR, visible, UV, X-ray, and gamma bands of the electromagnetic spectrum, the wavelength of the incident electromagnetic wave is respected. The proposed evaluation comprises a brief description of a Snell's law-based semi-analytic model of electromagnetic wave propagation through a layered material. We also demonstrate the expected anti-reflective and shielding effects in the X-ray and gamma-ray bands, respectively. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2020 Electronic address https://content.sciendo.com/view/journals/msr/19/4/article-p144.xml
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