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Transmission of very slow electrons as a diagnostic tool

SYSNO ASEP	0507132
Document Type	C - Proceedings Paper (int. conf.)
R&D Document Type	Conference Paper
Title	Transmission of very slow electrons as a diagnostic tool
Author(s)	Frank, Luděk (UPT-D)_{RID, SAI, ORCID} Nebesářová, Jana (BC-A)_{RID, ORCID} Vancová, Marie (BC-A)_{RID, ORCID} Paták, Aleš (UPT-D)_{RID, ORCID, SAI} Mikmeková, Eliška (UPT-D)_RID Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID}
Number of authors	6
Source Title	NANOCON 2013 - 5th International Conference Proceedings. - Ostrava : TANGER Ltd, 2014 - ISBN 978-80-87294-47-5
Pages	s. 503-508
Number of pages	6 s.
Publication form	Print - P
Action	International Conference NANOCON 2013 /5./
Event date	16.10.2013-18.10.2013
VEvent location	Brno
Country	CZ - Czech Republic
Event type	WRD
Language	eng - English
Country	CZ - Czech Republic
Keywords	electron microscopy ; slow electrons ; STEM ; graphene ; ultrathin tissue sections
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
OECD category	Nano-materials (production and properties)
Subject RIV - cooperation	Biology Centre (since 2006) - Biochemistry
R&D Projects	GAP108/11/2270 GA ČR - Czech Science Foundation (CSF)
	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
Institutional support	UPT-D - RVO:68081731 ; BC-A - RVO:60077344
UT WOS	000352070900089
Annotation	The penetration of electrons through solids is retarded by sequences of their interactions with the matter in which the electron changes its direction of motion and loses its energy. Inelastic collisions, the intensity of which reaches a maximum at around 50 electronvolts (eV) and drops steeply on both sides of this fuzzy threshold, are decisive for the penetration of electrons. Transmission microscopy (TEM or STEM) observes thin samples of tens to hundreds of nanometres in thickness by passing electrons of energies of tens to hundreds of kiloelectronvolts through them. The range below 50 eV has recently been utilized in the examination of surfaces with reflected electrons, where high image resolution is achieved thanks to the retardation of electrons close to the sample surface in the ´cathode lens´ . In this lens, the role of the cathode is played by the sample itself, biased to a high negative potential. This principle can also be utilized in the transmission mode with samples of a thickness at and below 10 nm. This method has recently been implemented and verified on graphene samples prepared by various methods. The results have made it possible to diagnose the continuity and quality of the graphene flakes. Furthermore, series of experiments have been performed involving the observation of ultrathin tissue sections with electrons decelerated to about 500 eV and less, where they provide an image contrast of the cell ultrastructure much higher than that provided by traditional microscopic modes.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2020

Number of the records: 1