Number of the records: 1  

Transmission of very slow electrons as a diagnostic tool

  1. 1.
    SYSNO ASEP0507132
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleTransmission of very slow electrons as a diagnostic tool
    Author(s) Frank, Luděk (UPT-D) RID, SAI, ORCID
    Nebesářová, Jana (BC-A) RID, ORCID
    Vancová, Marie (BC-A) RID, ORCID
    Paták, Aleš (UPT-D) RID, ORCID, SAI
    Mikmeková, Eliška (UPT-D) RID
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Number of authors6
    Source TitleNANOCON 2013 - 5th International Conference Proceedings. - Ostrava : TANGER Ltd, 2014 - ISBN 978-80-87294-47-5
    Pagess. 503-508
    Number of pages6 s.
    Publication formPrint - P
    ActionInternational Conference NANOCON 2013 /5./
    Event date16.10.2013-18.10.2013
    VEvent locationBrno
    CountryCZ - Czech Republic
    Event typeWRD
    Languageeng - English
    CountryCZ - Czech Republic
    Keywordselectron microscopy ; slow electrons ; STEM ; graphene ; ultrathin tissue sections
    Subject RIVJA - Electronics ; Optoelectronics, Electrical Engineering
    OECD categoryNano-materials (production and properties)
    Subject RIV - cooperationBiology Centre (since 2006) - Biochemistry
    R&D ProjectsGAP108/11/2270 GA ČR - Czech Science Foundation (CSF)
    TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportUPT-D - RVO:68081731 ; BC-A - RVO:60077344
    UT WOS000352070900089
    AnnotationThe penetration of electrons through solids is retarded by sequences of their interactions with the matter in which the electron changes its direction of motion and loses its energy. Inelastic collisions, the intensity of which reaches a maximum at around 50 electronvolts (eV) and drops steeply on both sides of this fuzzy threshold, are decisive for the penetration of electrons. Transmission microscopy (TEM or STEM) observes thin samples of tens to hundreds of nanometres in thickness by passing electrons of energies of tens to hundreds of kiloelectronvolts through them. The range below 50 eV has recently been utilized in the examination of surfaces with reflected electrons, where high image resolution is achieved thanks to the retardation of electrons close to the sample surface in the ´cathode lens´ . In this lens, the role of the cathode is played by the sample itself, biased to a high negative potential. This principle can also be utilized in the transmission mode with samples of a thickness at and below 10 nm. This method has recently been implemented and verified on graphene samples prepared by various methods. The results have made it possible to diagnose the continuity and quality of the graphene flakes. Furthermore, series of experiments have been performed involving the observation of ultrathin tissue sections with electrons decelerated to about 500 eV and less, where they provide an image contrast of the cell ultrastructure much higher than that provided by traditional microscopic modes.
    WorkplaceInstitute of Scientific Instruments
    ContactMartina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
    Year of Publishing2020
Number of the records: 1