Number of the records: 1
Transmission of very slow electrons as a diagnostic tool
- 1.
SYSNO ASEP 0507132 Document Type C - Proceedings Paper (int. conf.) R&D Document Type Conference Paper Title Transmission of very slow electrons as a diagnostic tool Author(s) Frank, Luděk (UPT-D) RID, SAI, ORCID
Nebesářová, Jana (BC-A) RID, ORCID
Vancová, Marie (BC-A) RID, ORCID
Paták, Aleš (UPT-D) RID, ORCID, SAI
Mikmeková, Eliška (UPT-D) RID
Müllerová, Ilona (UPT-D) RID, SAI, ORCIDNumber of authors 6 Source Title NANOCON 2013 - 5th International Conference Proceedings. - Ostrava : TANGER Ltd, 2014 - ISBN 978-80-87294-47-5 Pages s. 503-508 Number of pages 6 s. Publication form Print - P Action International Conference NANOCON 2013 /5./ Event date 16.10.2013-18.10.2013 VEvent location Brno Country CZ - Czech Republic Event type WRD Language eng - English Country CZ - Czech Republic Keywords electron microscopy ; slow electrons ; STEM ; graphene ; ultrathin tissue sections Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Nano-materials (production and properties) Subject RIV - cooperation Biology Centre (since 2006) - Biochemistry R&D Projects GAP108/11/2270 GA ČR - Czech Science Foundation (CSF) TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) Institutional support UPT-D - RVO:68081731 ; BC-A - RVO:60077344 UT WOS 000352070900089 Annotation The penetration of electrons through solids is retarded by sequences of their interactions with the matter in which the electron changes its direction of motion and loses its energy. Inelastic collisions, the intensity of which reaches a maximum at around 50 electronvolts (eV) and drops steeply on both sides of this fuzzy threshold, are decisive for the penetration of electrons. Transmission microscopy (TEM or STEM) observes thin samples of tens to hundreds of nanometres in thickness by passing electrons of energies of tens to hundreds of kiloelectronvolts through them. The range below 50 eV has recently been utilized in the examination of surfaces with reflected electrons, where high image resolution is achieved thanks to the retardation of electrons close to the sample surface in the ´cathode lens´ . In this lens, the role of the cathode is played by the sample itself, biased to a high negative potential. This principle can also be utilized in the transmission mode with samples of a thickness at and below 10 nm. This method has recently been implemented and verified on graphene samples prepared by various methods. The results have made it possible to diagnose the continuity and quality of the graphene flakes. Furthermore, series of experiments have been performed involving the observation of ultrathin tissue sections with electrons decelerated to about 500 eV and less, where they provide an image contrast of the cell ultrastructure much higher than that provided by traditional microscopic modes. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2020
Number of the records: 1