Localized deoxygenation of graphene oxide foil by ion microbeam writing

Cutroneo, Mariapompea; Havránek, Vladimír; Macková, Anna; Malinský, Petr; Torrisi, L.; Lorinčík, J.; Luxa, J.; Szokolova, K.; Sofer, Z.; Stammers, James H.

doi:https://dx.doi.org/10.1016/j.vacuum.2019.01.055

Number of the records: 1

Localized deoxygenation of graphene oxide foil by ion microbeam writing

1.

SYSNO ASEP	0504074
Document Type	J - Journal Article
R&D Document Type	Journal Article
Subsidiary J	Článek ve WOS
Title	Localized deoxygenation of graphene oxide foil by ion microbeam writing
Author(s)	Cutroneo, Mariapompea (UJF-V)_{ORCID, RID, SAI} Havránek, Vladimír (UJF-V)_{RID, SAI, ORCID} Macková, Anna (UJF-V)_{RID, ORCID, SAI} Malinský, Petr (UJF-V)_{RID, ORCID, SAI} Torrisi, L. (IT) Lorinčík, J. (CZ) Luxa, J. (CZ) Szokolova, K. (CZ) Sofer, Z. (CZ) Stammers, James H. (UJF-V)
Number of authors	10
Source Title	Vacuum. - : Elsevier - ISSN 0042-207X Roč. 163, č. 5 (2019), s. 10-14
Number of pages	5 s.
Publication form	Print - P
Language	eng - English
Country	GB - United Kingdom
Keywords	ion microbeam writing ; graphene oxide ; deoxygenation
Subject RIV	BG - Nuclear, Atomic and Molecular Physics, Colliders
OECD category	Nuclear physics
R&D Projects	LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	GA16-05167S GA ČR - Czech Science Foundation (CSF)
Method of publishing	Limited access
Institutional support	UJF-V - RVO:61389005
UT WOS	000462690400002
EID SCOPUS	85061096598
DOI	10.1016/j.vacuum.2019.01.055
Annotation	An efficient mask-less production of patterns in insulating foils of graphene-oxide was carried out under impact of 5 MeV alpha particle beams delivered by the Ion Micro Beam system at the Tandetron Laboratory of the Nuclear Physics Institute in Rez (Czech Republic). Graphene-oxide (GO) matrix has been exposed to controlled fluences with the aim of inducing deoxygenation and enhancement of the electrical conductivity in selected areas of the exposed samples. The reported designed patterns and their sharp edge profiles demonstrate the feasibility of the process. The compositional changes in the exposed areas of the GO were investigated by Rutherford backscattering spectrometry, elastic recoil detection analysis, scanning electron microscopy, and correlated with the electrical properties measured by a standard 2-point probe technique.
Workplace	Nuclear Physics Institute
Contact	Markéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
Year of Publishing	2020
Electronic address	https://doi.org/10.1016/j.vacuum.2019.01.055

Number of the records: 1