Correlative imaging using CL and STEM detector in a SEM

Number of the records: 1

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SYSNO ASEP	0501297
Document Type	A - Abstract
R&D Document Type	The record was not marked in the RIV
R&D Document Type	Není vybrán druh dokumentu
Title	Correlative imaging using CL and STEM detector in a SEM
Author(s)	Skoupý, Radim (UPT-D)_{RID, ORCID, SAI} Krzyžánek, Vladislav (UPT-D)_{RID, ORCID, SAI}
Number of authors	2
Source Title	Mikroskopie 2018. - Praha : Československá mikroskopická společnost, 2018 S. 26
Number of pages	1 s.
Publication form	Print - P
Action	Mikroskopie 2018
Event date	14.05.2018 - 16.05.2018
VEvent location	Lednice na Moravě
Country	CZ - Czech Republic
Event type	EUR
Language	eng - English
Country	CZ - Czech Republic
Keywords	correlative imaging ; STEM ; SEM
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
OECD category	Electrical and electronic engineering
R&D Projects	GA17-15451S GA ČR - Czech Science Foundation (CSF)
	TG03010046 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
	LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UPT-D - RVO:68081731
Annotation	Nowadays, a correlative imaging is one of the main topics in the field of electron microscopy, because it enables to study a sample from different points of view by comparing several different signale induced by incident primary electron beam.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2019

Number of the records: 1