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Secondary electron spectra of semi-crystalline polymers A novel polymer characterisation tool?
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SYSNO ASEP 0498772 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Secondary electron spectra of semi-crystalline polymers A novel polymer characterisation tool? Author(s) Dapor, M. (IT)
Masters, R. (GB)
Ross, I. (GB)
Lidzey, D. (GB)
Pearson, A. (US)
Abril, I. (ES)
Garcia-Molina, R. (ES)
Sharp, J. (GB)
Unčovský, M. (CZ)
Vystavěl, T. (CZ)
Mika, Filip (UPT-D) RID, SAI, ORCID
Rodenburg, C. (GB)Number of authors 12 Source Title Journal of Electron Spectroscopy and Related Phenomena. - : Elsevier - ISSN 0368-2048
Roč. 222, JAN (2018), s. 95-105Number of pages 11 s. Publication form Print - P Language eng - English Country NL - Netherlands Keywords energy ; microscope ; films ; semiconductors ; spectroscopy Subject RIV JA - Electronics ; Optoelectronics, Electrical Engineering OECD category Coating and films Institutional support UPT-D - RVO:68081731 UT WOS 000423638100014 EID SCOPUS 85028364158 DOI 10.1016/j.elspec.2017.08.001 Annotation The nano-scale dispersion of ordered/disordered phases in semi-crystalline polymers can strongly influence their performance e.g. in terms of mechanical properties and/or electronic properties. However, to reveal the latter in scanning electron microscopy (SEM) often requires invasive sample preparation (etching of amorphous phase), because SEM usually exploits topographical contrast or yield differences between different materials. However, for pure carbon materials the secondary spectra were shown to differ substantially with increased order/disorder. The aims here is to gain an understanding of the shape of secondary electron spectrum (SES) of a widely used semi-crystalline polymer regioregular poly(3-hexylthiophene-2,5-diyl), commonly known as P3HT, and its links to the underlying secondary electron emission mechanisms so SES can be exploited for the mapping the nano-morphology. The comparison of simulated and experimental SES shows an excellent agreement, revealing a peak (at about 0.8 eV) followed by a broad shoulder (between 2 eV and 4.5 eV) with respective relative intensities reflecting order/disorder. Workplace Institute of Scientific Instruments Contact Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178 Year of Publishing 2019
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