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Ion-beam lithography: A promising technique for the patterning of graphene oxide foil

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    SYSNO ASEP0495721
    Document TypeC - Proceedings Paper (int. conf.)
    R&D Document TypeConference Paper
    TitleIon-beam lithography: A promising technique for the patterning of graphene oxide foil
    Author(s) Cutroneo, Mariapompea (UJF-V) ORCID, RID, SAI
    Havránek, Vladimír (UJF-V) RID, SAI, ORCID
    Macková, Anna (UJF-V) RID, ORCID, SAI
    Malinský, Petr (UJF-V) RID, ORCID, SAI
    Torrisi, L. (IT)
    Perez-Hernandez, J. A. (ES)
    Roso, L. (ES)
    Luxa, J. (CZ)
    Sofer, Z. (CZ)
    Bottger, R. (DE)
    Number of authors10
    Article number090007
    Source TitleAIP Conference Proceedings, 17th International Conference on Ion Sources, 2011. - Melville : AIP Publishing, 2018 - ISSN 0094-243X - ISBN 978-0-7354-1727-4
    Number of pages3 s.
    Publication formPrint - P
    Action17th International Conference on Ion Sources
    Event date15.09.2017 - 20.09.2017
    VEvent locationGeneva
    CountryCH - Switzerland
    Event typeWRD
    Languageeng - English
    CountryUS - United States
    Keywordsgraphene oxide foil ; ion beam lithography ; deoxygenation
    Subject RIVBG - Nuclear, Atomic and Molecular Physics, Colliders
    OECD categoryNuclear physics
    R&D ProjectsLM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA16-05167S GA ČR - Czech Science Foundation (CSF)
    EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportUJF-V - RVO:61389005
    UT WOS000457042700146
    EID SCOPUS85054178862
    DOI10.1063/1.5053388
    AnnotationSelective deoxygenation of graphene oxide has been conducted with regard with the design and fabrication of graphene based devices. The ion beam lithography is considered to be a powerful method for patterning onto graphene oxide foil. A helium beam has been used for both direct patterning onto graphene oxide foil and simultaneous online characterisation of its structural and compositional changes. Scanning electron microscopy, energy dispersive spectroscopy and Rutherford backscattering spectrometry analyses have been accurately employed to reveal and monitor the deoxygenation of the graphene oxide foil demonstrating the reliability of the direct patterning using the ion beam lithography technique.
    WorkplaceNuclear Physics Institute
    ContactMarkéta Sommerová, sommerova@ujf.cas.cz, Tel.: 266 173 228
    Year of Publishing2019
Number of the records: 1  

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