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Correlative cryo-qSTEM-CL imaging in a SEM

SYSNO ASEP	0495552
Document Type	A - Abstract
R&D Document Type	The record was not marked in the RIV
R&D Document Type	Není vybrán druh dokumentu
Title	Correlative cryo-qSTEM-CL imaging in a SEM
Author(s)	Skoupý, Radim (UPT-D)_{RID, ORCID, SAI} Krzyžánek, Vladislav (UPT-D)_{RID, ORCID, SAI}
Number of authors	2
Source Title	19th International Microscopy Congress (IMC19). Book of Abstracts.. - Sydney : LMA, 2018
Number of pages	1 s.
Publication form	Print - P
Action	International Microscopy Congress (IMC19) /19./
Event date	09.09.2018 - 14.09.2018
VEvent location	Sydney
Country	AU - Australia
Event type	WRD
Language	eng - English
Country	AU - Australia
Keywords	correlative imaging ; quantitative imaging ; Monte Carlo
Subject RIV	JA - Electronics ; Optoelectronics, Electrical Engineering
OECD category	Nano-materials (production and properties)
R&D Projects	GA17-15451S GA ČR - Czech Science Foundation (CSF)
	LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UPT-D - RVO:68081731
Annotation	Nowadays, a correlative microscopy of several signals is one of the main topics in the electron microscopy field. In some studies, a localization, distribution and density of light emitting labels or particles in a sample is important. Unfortunately, not all light emitting structures are possible to be imaged at room temperature. Very fine particles like quantum dots with diameter in terms of nm are recognizable only at very low temperatures and with appropriate anticontamination shielding, because a contamination layer of hydrocarbon deposits can disturb whole measuring at the first electron beam scan. Qualitative imaging can be changed to quantitative by using Monte Carlo (MC) simulations of samples, with known composition and density, which can bring a new dimension to thin samples imaging by STEM (Scanning Transmission Electron Microscopy). Recalculation of calibrated images via MC gives the information about the local thickness of the sample and total mass of the imaged particle with high precision (approach published in was used). This information can be compared with local cathodoluminescence (CL) activity or quantitative imaging in backscattered electrons.
Workplace	Institute of Scientific Instruments
Contact	Martina Šillerová, sillerova@ISIBrno.Cz, Tel.: 541 514 178
Year of Publishing	2019

Number of the records: 1