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Giant magnetic-field-induced strain in Ni-Mn-Ga micropillars
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SYSNO ASEP 0494806 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Giant magnetic-field-induced strain in Ni-Mn-Ga micropillars Author(s) Musiienko, D. (FI)
Straka, Ladislav (FZU-D) ORCID
Klimša, Ladislav (FZU-D) ORCID
Saren, A. (FI)
Sozinov, A. (FI)
Heczko, Oleg (FZU-D) RID, ORCID
Ullakko, K. (FI)Number of authors 7 Source Title Scripta Materialia. - : Elsevier - ISSN 1359-6462
Roč. 150, Jun (2018), s. 173-176Number of pages 4 s. Language eng - English Country US - United States Keywords ferromagnetic shape memory ; twinning ; MEMS ; focused ion beam ; micro-magneto-mechanical systems Subject RIV BM - Solid Matter Physics ; Magnetism OECD category Condensed matter physics (including formerly solid state physics, supercond.) R&D Projects GA16-00043S GA ČR - Czech Science Foundation (CSF) LO1409 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) LM2015088 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support FZU-D - RVO:68378271 UT WOS 000432612500039 EID SCOPUS 85044758115 DOI 10.1016/j.scriptamat.2018.03.020 Annotation We report on the observation of fully reversible magnetic-field-induced strain of 6% in a single-crystalline micropillar fabricated from a bulk Ni50Mn28.5Ga21.5 single crystal. Xe plasma source focused ion beam column milling technology was used to machine 50 × 50 × 100 μm3 cuboid pillars. The removal of about 2 μm of ion-beam-damaged surface layer enabled magnetic field actuation in pillars. Our results demonstrate the feasibility of manufacturing of micrometre-sized magnetic shape memory actuators by focused ion beam technique. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2019
Number of the records: 1