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Enhanced oxidation of TiO.sub.2./sub. films prepared by high power impulse magnetron sputtering running in metallic mode
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SYSNO ASEP 0486984 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title Enhanced oxidation of TiO2 films prepared by high power impulse magnetron sputtering running in metallic mode Author(s) Straňák, V. (CZ)
Kratochvíl, J. (CZ)
Olejníček, Jiří (FZU-D) RID, ORCID
Kšírová, Petra (FZU-D) RID, ORCID
Sezemsky, P. (CZ)
Čada, Martin (FZU-D) RID, ORCID, SAI
Hubička, Zdeněk (FZU-D) RID, ORCID, SAINumber of authors 7 Article number 171914 Source Title Journal of Applied Physics. - : AIP Publishing - ISSN 0021-8979
Roč. 121, č. 17 (2017), s. 1-9Number of pages 9 s. Language eng - English Country US - United States Keywords sputter deposition ; plasma deposition ; gas discharges ; metallic thin films ; probe plasma diagnostics Subject RIV BL - Plasma and Gas Discharge Physics OECD category Fluids and plasma physics (including surface physics) R&D Projects GA15-00863S GA ČR - Czech Science Foundation (CSF) Institutional support FZU-D - RVO:68378271 UT WOS 000400623700016 EID SCOPUS 85014857019 DOI 10.1063/1.4977825 Annotation A method is introduced that allows suppressing unwanted effects of target poisoning during reactive high-power impulse magnetron sputtering (R-HiPIMS) employed for deposition of oxide films. The method, based on higher reactivity of excited/activated oxygen species, is studied and demonstrated on TiO2 films deposited in R-HiPIMS discharge running very close to the metallic mode with a high deposition rate. An external source of energetic plasma that activates oxygen gas, delivered to the vicinity of the substrate, is combined with conventional R-HiPIMS of the Ti target. The activated oxygen species enable reducing the total flow rate, which simultaneously results in suppression of the target poisoning effect. On the other hand, sufficient oxidation and growth of transparent crystalline TiO2 films were observed. Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2018
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