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Enhanced oxidation of TiO.sub.2./sub. films prepared by high power impulse magnetron sputtering running in metallic mode

  1. 1.
    SYSNO ASEP0486984
    Document TypeJ - Journal Article
    R&D Document TypeJournal Article
    Subsidiary JČlánek ve WOS
    TitleEnhanced oxidation of TiO2 films prepared by high power impulse magnetron sputtering running in metallic mode
    Author(s) Straňák, V. (CZ)
    Kratochvíl, J. (CZ)
    Olejníček, Jiří (FZU-D) RID, ORCID
    Kšírová, Petra (FZU-D) RID, ORCID
    Sezemsky, P. (CZ)
    Čada, Martin (FZU-D) RID, ORCID, SAI
    Hubička, Zdeněk (FZU-D) RID, ORCID, SAI
    Number of authors7
    Article number171914
    Source TitleJournal of Applied Physics. - : AIP Publishing - ISSN 0021-8979
    Roč. 121, č. 17 (2017), s. 1-9
    Number of pages9 s.
    Languageeng - English
    CountryUS - United States
    Keywordssputter deposition ; plasma deposition ; gas discharges ; metallic thin films ; probe plasma diagnostics
    Subject RIVBL - Plasma and Gas Discharge Physics
    OECD categoryFluids and plasma physics (including surface physics)
    R&D ProjectsGA15-00863S GA ČR - Czech Science Foundation (CSF)
    Institutional supportFZU-D - RVO:68378271
    UT WOS000400623700016
    EID SCOPUS85014857019
    DOI10.1063/1.4977825
    AnnotationA method is introduced that allows suppressing unwanted effects of target poisoning during reactive high-power impulse magnetron sputtering (R-HiPIMS) employed for deposition of oxide films. The method, based on higher reactivity of excited/activated oxygen species, is studied and demonstrated on TiO2 films deposited in R-HiPIMS discharge running very close to the metallic mode with a high deposition rate. An external source of energetic plasma that activates oxygen gas, delivered to the vicinity of the substrate, is combined with conventional R-HiPIMS of the Ti target. The activated oxygen species enable reducing the total flow rate, which simultaneously results in suppression of the target poisoning effect. On the other hand, sufficient oxidation and growth of transparent crystalline TiO2 films were observed.
    WorkplaceInstitute of Physics
    ContactKristina Potocká, potocka@fzu.cz, Tel.: 220 318 579
    Year of Publishing2018
Number of the records: 1  

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