Number of the records: 1
X-ray analysis of fully depleted CCDs with small pixel size
- 1.
SYSNO ASEP 0485070 Document Type J - Journal Article R&D Document Type Journal Article Subsidiary J Článek ve WOS Title X-ray analysis of fully depleted CCDs with small pixel size Author(s) Kotov, I.V. (US)
Haupt, J. (US)
Kubánek, Petr (FZU-D) RID
O'Connor, P. (US)
Takacs, P. (US)Number of authors 5 Source Title Nuclear Instruments & Methods in Physics Research Section A. - : Elsevier - ISSN 0168-9002
Roč. 787, Jul (2015), s. 12-19Number of pages 8 s. Language eng - English Country NL - Netherlands Keywords charge diffusion ; Charge transfer efficiency ; CTE ; CCD Subject RIV BN - Astronomy, Celestial Mechanics, Astrophysics OECD category Astronomy (including astrophysics,space science) Institutional support FZU-D - RVO:68378271 UT WOS 000354869900004 EID SCOPUS 84939934922 DOI 10.1016//j.nima.2014.10.027 Annotation X-ray frames offer a lot of information about CCD. sources are traditionally being used for CCD gain and charge transfer efficiency (CTE) measurements. We demonstrate how spectral lines of 55Fe and 241Am rad. sources are used for system linearity measurements. The pixel size of modern scientific CCDs is getting smaller. The charge diffusion causes the charge spread among neighboring pixels especially in thick fully depleted sensors. This enables measurement of the charge diffusion using 55Fe X-rays. On the other hand, the usual CTE characterization method based on single pixel X-ray events becomes statistically deficient. A new way of measuring CTE using shape and amplitude analysis of X-ray clusters is presented and discussed. The lateral diffusion measured using e2v CCD250 is presented and implications for X-ray cluster size and expected cluster shape are discussed. The CTE analysis using total X-ray cluster amplitude is presented.
Workplace Institute of Physics Contact Kristina Potocká, potocka@fzu.cz, Tel.: 220 318 579 Year of Publishing 2018
Number of the records: 1